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介电相关杂化泛函在预测金属氧化物半导体光电性质方面的准确性:与多体GW方法及实验的全面比较

Accuracy of dielectric-dependent hybrid functionals in the prediction of optoelectronic properties of metal oxide semiconductors: a comprehensive comparison with many-body GW and experiments.

作者信息

Gerosa M, Bottani C E, Di Valentin C, Onida G, Pacchioni G

机构信息

Institute for Molecular Engineering, University of Chicago, Chicago, IL 60637, United States of America.

出版信息

J Phys Condens Matter. 2018 Jan 31;30(4):044003. doi: 10.1088/1361-648X/aa9725.

Abstract

Understanding the electronic structure of metal oxide semiconductors is crucial to their numerous technological applications, such as photoelectrochemical water splitting and solar cells. The needed experimental and theoretical knowledge goes beyond that of pristine bulk crystals, and must include the effects of surfaces and interfaces, as well as those due to the presence of intrinsic defects (e.g. oxygen vacancies), or dopants for band engineering. In this review, we present an account of the recent efforts in predicting and understanding the optoelectronic properties of oxides using ab initio theoretical methods. In particular, we discuss the performance of recently developed dielectric-dependent hybrid functionals, providing a comparison against the results of many-body GW calculations, including G W as well as more refined approaches, such as quasiparticle self-consistent GW. We summarize results in the recent literature for the band gap, the band level alignment at surfaces, and optical transition energies in defective oxides, including wide gap oxide semiconductors and transition metal oxides. Correlated transition metal oxides are also discussed. For each method, we describe successes and drawbacks, emphasizing the challenges faced by the development of improved theoretical approaches. The theoretical section is preceded by a critical overview of the main experimental techniques needed to characterize the optoelectronic properties of semiconductors, including absorption and reflection spectroscopy, photoemission, and scanning tunneling spectroscopy (STS).

摘要

了解金属氧化物半导体的电子结构对于其众多技术应用至关重要,例如光电化学水分解和太阳能电池。所需的实验和理论知识超出了原始块状晶体的范畴,必须涵盖表面和界面的影响,以及由于本征缺陷(如氧空位)或用于能带工程的掺杂剂的存在所产生的影响。在这篇综述中,我们阐述了近期利用从头算理论方法预测和理解氧化物光电性质的相关工作。特别地,我们讨论了最近开发的依赖于介电常数的杂化泛函的性能,并与多体GW计算结果进行了比较,包括G W以及更精细的方法,如准粒子自洽GW。我们总结了近期文献中关于带隙、表面能带水平对齐以及缺陷氧化物(包括宽禁带氧化物半导体和过渡金属氧化物)中的光学跃迁能量的结果。还讨论了关联过渡金属氧化物。对于每种方法,我们描述了其优缺点,强调了改进理论方法发展所面临的挑战。在理论部分之前,对表征半导体光电性质所需的主要实验技术进行了批判性综述,包括吸收和反射光谱、光电子能谱以及扫描隧道谱(STS)。

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