Espinoza-Quiñones Fernando Rodolfo, Módenes Aparecido Nivaldo, Dos Santos Joelmir, Obregón Phallcha Luízar, de Pauli Aline Roberta
Department of Chemical Engineering, Postgraduate Program, West Parana State University, Campus of Toledo, rua da Faculdade 645, Jd. Santa Maria, 85903-000 Toledo, PR, Brazil.
Department of Chemical Engineering, Postgraduate Program, West Parana State University, Campus of Toledo, rua da Faculdade 645, Jd. Santa Maria, 85903-000 Toledo, PR, Brazil.
Appl Radiat Isot. 2018 Jul;137:80-90. doi: 10.1016/j.apradiso.2018.03.016. Epub 2018 Mar 20.
In this work, the analytical capability of the total reflection X-ray fluorescence technique with the S2 PICOFOX spectrometer was investigated. A set of certified reference materials was prepared as solid particulate for TXRF analysis. Experimental data of sensitivity, limits of detection and recovery for many elements were obtained. Good sensitivity and limits of detection with a good recovery range of around 90-110% were achieved. Thus, the TXRF technique exhibits a good analytical potential for its applicability on different materials.
在这项工作中,研究了采用S2 PICOFOX光谱仪的全反射X射线荧光技术的分析能力。制备了一组经认证的参考材料作为用于TXRF分析的固体颗粒。获得了许多元素的灵敏度、检测限和回收率的实验数据。实现了良好的灵敏度和检测限,回收率范围在90-110%左右。因此,TXRF技术因其对不同材料的适用性而展现出良好的分析潜力。