Kwon Min-Su, Lee Sung-Gap, Kim Kyeong-Min
Department of Materials Engineering and Convergence Technology, ERI, Gyeongsang National University, Jinju 52828, Korea.
J Nanosci Nanotechnol. 2018 Sep 1;18(9):5936-5941. doi: 10.1166/jnn.2018.15592.
In this study, Barium Titanate (BT)/Lead Zirconate Titanate (PZT) multilayer thin films were fabricated by the spin-coating method on Pt (200 nm)/Ti (10 nm) SiO2 (100 nm)/P-Si (100) substrates using BaTiO3 and Pb(Zr0.90Ti0.10)O3 metal alkoxide solutions. The coating and heating procedure was repeated several times to form the multilayer thin films. All of BT/PZT multilayer thin films show X-ray diffraction patterns typical to a polycrystalline perovskite structure and a uniform and void free grain microstructure. The thickness of the BT and PZT film by one-cycle of drying/sintering was approximately 50 nm and all of the films consisted of fine grains with a flat surface morphology. The electrocaloric properties of BT/PZT thin films were investigated by indirect estimation. The results showed that the temperature change ΔT can be calculated as a function of temperature using Maxwell's relation; the temperature change reaches a maximum value of ~1.85 °C at 135 °C under an applied electric field of 260 kV/cm.
在本研究中,使用钛酸钡(BT)和锆钛酸铅(Pb(Zr0.90Ti0.10)O3,即PZT)金属醇盐溶液,通过旋涂法在Pt(200纳米)/Ti(10纳米)/SiO2(100纳米)/P-Si(100)衬底上制备了钛酸钡(BT)/锆钛酸铅(PZT)多层薄膜。涂层和加热过程重复多次以形成多层薄膜。所有BT/PZT多层薄膜均呈现出典型的多晶钙钛矿结构的X射线衍射图谱以及均匀且无孔洞的晶粒微观结构。经过一个干燥/烧结循环后,BT和PZT薄膜的厚度约为50纳米,并且所有薄膜均由具有平整表面形态的细晶粒组成。通过间接估算研究了BT/PZT薄膜的电热性能。结果表明,温度变化ΔT可根据麦克斯韦关系作为温度的函数进行计算;在260 kV/cm的外加电场下,温度变化在135°C时达到最大值约1.85°C。