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用于消除X射线显微断层扫描中环形伪影的先进技术。

Superior techniques for eliminating ring artifacts in X-ray micro-tomography.

作者信息

Vo Nghia T, Atwood Robert C, Drakopoulos Michael

出版信息

Opt Express. 2018 Oct 29;26(22):28396-28412. doi: 10.1364/OE.26.028396.

Abstract

Synchrotron-based X-ray micro-tomography systems often suffer severe ring artifacts in reconstructed images. In sinograms the artifacts appear as straight lines or stripe artifacts. These artifacts are caused by the irregular response of a detecting system giving rise to a variety of observed types of stripes: full stripes, partial stripes, fluctuating stripes, and unresponsive stripes. The use of pre-processing techniques such as distortion correction or phase retrieval blurs and enlarges these stripes. It is impossible for a single approach to remove all types of stripe artifacts. Here, we propose three techniques for tackling all of them. The proposed techniques are easy to implement; do not generate extra stripe artifacts and void-center artifacts; and give superior quality on challenging data sets and in comparison with other techniques. Implementations in Python and a challenging data set are available for download.

摘要

基于同步加速器的X射线显微断层扫描系统在重建图像中常常出现严重的环形伪影。在正弦图中,这些伪影表现为直线或条纹状伪影。这些伪影是由检测系统的不规则响应引起的,从而产生了多种观察到的条纹类型:全条纹、部分条纹、波动条纹和无响应条纹。使用诸如失真校正或相位恢复等预处理技术会使这些条纹模糊并放大。单一方法不可能去除所有类型的条纹伪影。在此,我们提出三种技术来解决所有这些问题。所提出的技术易于实现;不会产生额外的条纹伪影和空洞中心伪影;并且在具有挑战性的数据集上以及与其他技术相比具有更高的质量。可下载Python实现代码和一个具有挑战性的数据集。

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