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硅-钼垂直异质结光电探测器具有高光响应度和低等效噪声功率。

Si-MoS Vertical Heterojunction for a Photodetector with High Responsivity and Low Noise Equivalent Power.

机构信息

School of Electrical Engineering , KAIST , Daehakro, Yuseong-gu , Daejeon 34141 , Republic of Korea.

Graphene/2D Materials Research Center , KAIST , Daehakro, Yuseong-gu , Daejeon 34141 , Republic of Korea.

出版信息

ACS Appl Mater Interfaces. 2019 Feb 20;11(7):7626-7634. doi: 10.1021/acsami.8b21629. Epub 2019 Feb 6.

Abstract

In this study, we propose the fabrication of a photodetector based on the heterostructure of p-type Si and n-type MoS. Mechanically exfoliated MoS flakes are transferred onto a Si layer; the resulting Si-MoS p-n photodiode shows excellent performance with a responsivity ( R) and detectivity ( D*) of 76.1 A/W and 10 Jones, respectively. In addition, the effect of the thickness of the depletion layer of the Si-MoS heterojunction on performance is investigated using the depletion layer model; based on the obtained results, we optimize the photoresponse of the device by varying the MoS thickness. Furthermore, low-frequency noise measurement is performed for the fabricated devices. The optimized device shows a low noise equivalent power (NEP) of 7.82 × 10 W Hz. Therefore, our proposed device could be utilized for various optoelectronic devices for low-light detection.

摘要

在这项研究中,我们提出了一种基于 p 型 Si 和 n 型 MoS 异质结构的光电探测器的制造方法。通过机械剥离法获得的 MoS 薄片转移到 Si 层上;所得的 Si-MoS p-n 光电二极管具有优异的性能,响应率(R)和探测率(D*)分别为 76.1 A/W 和 10 琼斯。此外,还使用耗尽层模型研究了 Si-MoS 异质结耗尽层厚度对性能的影响;根据得到的结果,通过改变 MoS 厚度来优化器件的光响应。此外,还对所制备的器件进行了低频噪声测量。优化后的器件的噪声等效功率(NEP)低至 7.82×10 W Hz。因此,我们提出的器件可用于各种用于低光检测的光电设备。

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