Yang Won Jun, Park Hanjin, Kim Da Sol, Ha Taewoo, Park Seung Jong, Ahn Min, Kim Jae Hoon, Kwon Young-Kyun, Cho Mann-Ho
Department of Physics and Applied Physics, Yonsei University, Seoul, 03722, Republic of Korea.
Department of Physics and Research Institute for Basic Sciences, Kyung Hee University, Seoul, 02447, Republic of Korea.
Sci Rep. 2019 Sep 6;9(1):12816. doi: 10.1038/s41598-019-49270-2.
Although some methods to improve phase-change memory efficiency have been proposed, an effective experimental approach to induce a phase-change like process without external heat energy has not yet been reported. Herein we have shown that GeTe is a prototype phase-change material, which can exhibit a non-thermal phase-change-like process under uniaxial stress. Due to its structural characteristics like directional structural instability and resonance bonding under 1% uniaxial stress, we observed that bond switching in the GeTe film between short and long bonds is possible. Due to this phase change, GeTe displays the same phase-change as crystal layer rotation. Crystal layer rotation has not been observed in the conventional phase change process using intermediate states, but it is related to the structural characteristics required for maintaining local coordination. Moreover, since the resonance bonding characteristics are effectively turned off upon applying uniaxial stress, the high-frequency dielectric constant can be significantly decreased. Our results also show that the most significant process in the non-thermal phase transition of phase-change materials is the modulation of the lattice relaxation process after the initial perturbation, rather than the method inducing the perturbation itself. Finally, these consequences suggest that a new type of phase-change memory is possible through changes in the optical properties under stress.
尽管已经提出了一些提高相变存储器效率的方法,但尚未报道一种无需外部热能就能诱导类似相变过程的有效实验方法。在此,我们表明GeTe是一种原型相变材料,在单轴应力下它能呈现出类似非热相变的过程。由于其结构特性,如在1%单轴应力下的定向结构不稳定性和共振键合,我们观察到GeTe薄膜中短键和长键之间的键切换是可能的。由于这种相变,GeTe表现出与晶体层旋转相同的相变。在使用中间态的传统相变过程中未观察到晶体层旋转,但它与维持局部配位所需的结构特性有关。此外,由于施加单轴应力时共振键合特性会有效关闭,高频介电常数会显著降低。我们的结果还表明,相变材料非热相变中最重要的过程是初始扰动后晶格弛豫过程的调制,而不是诱导扰动本身的方法。最后,这些结果表明通过应力下光学性质的变化有可能实现一种新型的相变存储器。