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拓扑非平凡DyPdBi薄膜的厚度依赖磁输运性质

Thickness-dependent magneto-transport properties of topologically nontrivial DyPdBi thin films.

作者信息

Bhardwaj Vishal, Bhattacharya Anupam, Varga Lajos K, Ganguli Ashok K, Chatterjee Ratnamala

机构信息

Department of Physics, Indian Institute of Technology Delhi, New Delhi 110016, India.

出版信息

Nanotechnology. 2020 Sep 18;31(38):384001. doi: 10.1088/1361-6528/ab99f3. Epub 2020 Jun 5.

Abstract

DyPdBi (DPB) is a topological semimetal which belongs to the rare-earth-based half-Heusler alloy family. In this work, we studied the thickness-dependent structural and magneto-transport properties of DPB thin films (20 to 60 nm) grown using pulsed laser deposition. The DPB thin films show (110) oriented growth on MgO(100) single crystal substrates. Longitudinal resistance data indicate metallic surface states dominated carrier transport and the suppression of semiconducting bulk state carriers for films ≤40 nm. We observe the weak antilocalization (WAL) effect and Shubnikov-de Hass (SdH) oscillations in the magneto-transport data. The presence of a single coherent transport channel (α∼ -0.50) is observed in the Hikami-Larkin-Nagaoka (HLN) fitting of WAL data. The power law temperature dependence of phase coherence length (L ) ∼ T indicates the observation of the 2D WAL effect and the presence of topological nontrivial surface states for films ≤40 nm. The 60 nm sample shows semiconducting resistivity behavior at higher temperature (>180 K) and HLN fitting results (α∼ -0.72, L ∼ T ) indicate the presence of partial decoupled top and bottom surface states. The Berry phase ∼π is extracted for thin films ≤40 nm, which further demonstrates the presence of Dirac fermions and nontrivial surface states. Band structure parameters are extracted by fitting SdH data to the standard Lifshitz-Kosevich formula. The sheet carrier concentration and cyclotron effective mass of carriers decrease with increasing thickness (20 nm to 60 nm) from ∼1.35 × 10 cm to 0.68 × 10 cm and from ∼0.26 m to 0.12 m, respectively. Our observations suggest that samples with a thickness ≤40 nm have transport properties dominated by surface states and samples with a thickness ≥60 nm have contributions from both bulk and surface states.

摘要

DyPdBi(DPB)是一种拓扑半金属,属于稀土基半赫斯勒合金家族。在本工作中,我们研究了使用脉冲激光沉积生长的DPB薄膜(20至60纳米)的厚度依赖性结构和磁输运性质。DPB薄膜在MgO(100)单晶衬底上呈现(110)取向生长。纵向电阻数据表明,对于厚度≤40纳米的薄膜,金属表面态主导载流子输运,而半导体体态载流子受到抑制。我们在磁输运数据中观察到弱反局域化(WAL)效应和舒布尼科夫 - 德哈斯(SdH)振荡。在WAL数据的日高 - 拉金 - 长冈(HLN)拟合中观察到存在单个相干输运通道(α∼ -0.50)。相位相干长度(L)∼T的幂律温度依赖性表明观察到二维WAL效应以及厚度≤40纳米的薄膜存在拓扑非平凡表面态。60纳米的样品在较高温度(>180 K)下表现出半导体电阻率行为,HLN拟合结果(α∼ -0.72,L∼T)表明存在部分解耦的顶部和底部表面态。对于厚度≤40纳米的薄膜,提取出的贝里相位∼π,这进一步证明了狄拉克费米子和非平凡表面态的存在。通过将SdH数据拟合到标准的利夫希茨 - 科瑟维奇公式来提取能带结构参数。薄膜载流子浓度和面内载流子有效质量随着厚度从20纳米增加到60纳米,分别从∼1.35×10¹² cm⁻² 降至0.68×10¹² cm⁻² 和从∼0.26 m₀降至0.12 m₀。我们的观察结果表明,厚度≤40纳米的样品的输运性质由表面态主导,而厚度≥60纳米的样品则同时有体态和表面态的贡献。

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