Ouahman Mina, Errifai Rachid, Asmi Hicham, Bouzekraoui Youssef, Douama Sanae, Bentayeb Farida, Bonutti Faustino
Mohammed V-Rabat University Faculty of Science, Laboratory of High Energy Physics Modelisation Simulation, Rabat, Morocco
Academic Hospital of Udine, Clinic of Medical Physics, Udine, Italy
Mol Imaging Radionucl Ther. 2020 Oct 19;29(3):118-123. doi: 10.4274/mirt.galenos.2020.21549.
Gallium-67 (Ga-67) imaging is affected by collimator penetration and scatter components owing to the high-energy (HE) gamma-ray emissions. The characterization of penetration and scatter distribution is essential for the optimization of low-energy high-resolution (LEHR), medium energy (ME), and HE collimators and for the development of an effective correction technique. We compared the image quality that can be achieved by 3 collimators for different energy windows using the SIMIND Monte Carlo code.
Simulation experiments were conducted for LEHR, ME, and HE collimators for Ga-67 point source placed at 12-cm distance from the detector surface using the Monte Carlo SIMIND simulation code. Their spectra point spread functions as well as the original, penetration, scattering, and X-rays curves were drawn and analyzed. The parameters full-width at half maximum and full-width at tenth maximum were also investigated.
The original, penetration, and scatter curves within 10% for LEHR were 34.46%, 33.52%, 17.29%, and 14.72%, respectively. Similarly, the original, penetration, scatter, and X-rays within 10% for ME and HE were 83.06%, 10.25%, 6.69%, and 0% and 81.44%, 11.51%, 7.05%, and 0%, respectively. The trade-off between spatial resolution and sensitivity was achieved by using the ME collimator at 185 photopeak of Ga-67.
The Monte Carlo simulation outcomes can be applied for optimal collimator designing and for the development of new correction method in Ga-67 imaging.
由于镓 - 67(Ga - 67)发射高能(HE)γ射线,其成像受准直器穿透和散射成分影响。穿透和散射分布的特征对于低能高分辨率(LEHR)、中能(ME)和高能准直器的优化以及有效校正技术的开发至关重要。我们使用SIMIND蒙特卡罗代码比较了3种准直器在不同能量窗下可实现的图像质量。
使用蒙特卡罗SIMIND模拟代码,对距离探测器表面12厘米处放置的Ga - 67点源的LEHR、ME和HE准直器进行模拟实验。绘制并分析了它们的光谱点扩散函数以及原始、穿透、散射和X射线曲线。还研究了半高宽和十分之一高宽参数。
LEHR的10%范围内的原始、穿透和散射曲线分别为34.46%、33.52%、17.29%和14.72%。同样,ME和HE的10%范围内的原始、穿透、散射和X射线分别为83.06%、10.25%、6.69%和0%以及81.44%、11.51%、7.05%和0%。在Ga - 67的185光峰处使用ME准直器实现了空间分辨率和灵敏度之间的权衡。
蒙特卡罗模拟结果可应用于Ga - 67成像中准直器的优化设计和新校正方法的开发。