Chiesa Mario, Livraghi Stefano, Paganini Maria Cristina, Salvadori Enrico, Giamello Elio
Dipartimento di Chimica, Università degli Studi di Torino Torino Italy
Chem Sci. 2020 Jul 1;11(26):6623-6641. doi: 10.1039/d0sc02876b.
Engineering defects in semiconducting metal oxides is a challenge that remains at the forefront of materials chemistry research. Nitrogen has emerged as one of the most attractive elements able to tune the photochemical and photocatalytic properties of semiconducting oxides, boosting visible-light harvesting and charge separation events, key elements in promoting solar driven chemical reactions. Doping with nitrogen is also a strategy suggested to obtain p-type conduction properties in oxides showing n-type features in their pristine state and to impart collective magnetic properties to the same systems. Here, we review the evolution in the understanding of the role of nitrogen doping in modifying the photochemical and electronic properties of the most common semiconducting oxides used in mentioned applications including: TiO, ZnO, SnO and zirconium titanates. With an emphasis on polycrystalline materials, we highlight the unique role of Electron Paramagnetic Resonance (EPR) spectroscopy in the direct detection of open-shell N-based defects and in the definition of their structural and electronic properties. Synthetic strategies for the insertion of nitrogen defects in the various matrices are also discussed, along with the influence of the corresponding low-lying energy states on the general electronic properties of the doped solids.
在半导体金属氧化物中制造工程缺陷是材料化学研究前沿面临的一项挑战。氮已成为能够调节半导体氧化物光化学和光催化性能的最具吸引力的元素之一,可增强可见光捕获和电荷分离过程,而这是促进太阳能驱动化学反应的关键因素。掺杂氮也是一种策略,旨在使原本呈现n型特性的氧化物获得p型导电性能,并赋予同一体系集体磁性。在此,我们回顾了对氮掺杂在改变上述应用中最常用的半导体氧化物(包括TiO、ZnO、SnO和钛酸锆)的光化学和电子性能方面所起作用的认识进展。重点关注多晶材料,我们强调了电子顺磁共振(EPR)光谱在直接检测开壳层氮基缺陷及其结构和电子性能定义方面的独特作用。还讨论了在各种基质中引入氮缺陷的合成策略,以及相应的低能态对掺杂固体总体电子性能的影响。