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通过透射电子显微镜观察植物角质层超微结构精细细节的方法。

Method for ultrastructural fine details of plant cuticles by transmission electron microscopy.

作者信息

Guignard Gaëtan

机构信息

Univ Lyon, Université Claude Bernard Lyon 1, CNRS, ENTPE, UMR 5023 LEHNA, F-69622, Villeurbanne, France.

出版信息

MethodsX. 2021 May 18;8:101391. doi: 10.1016/j.mex.2021.101391. eCollection 2021.

Abstract

This method for plant cuticles was adapted from spores and pollen procedure. It already enabled to prepare ultrathin plant cuticle sections of 60-70 nanometers of thickness, in high numbers as a routine, and allowed statistical measurements as any other macro- and/or micro-features. It provides through transmission electron microscope clean and contrasted observations of layers and sublayers of the cuticle, at a magnification over 100,000 times. It has been used efficiently for taxonomy, signature of environment and evolution topics since the end of the nineties (Gaëtan Guignard, 2019), however it is detailed here step by step for the first time, and illustrated. It can serve in the future for many purposes, like other taxonomical comparisons, palaeoreconstructions and evolutionary considerations. Value of the protocol•This method provides ultrathin plant cuticle sections of 60-70 nanometers of thickness•Details of layers and sublayers of the cuticle are easily observed•High numbers of sections allows statistical measurements as a routine.

摘要

这种植物角质层的方法改编自孢子和花粉的制备方法。它已经能够常规制备大量厚度为60至70纳米的超薄植物角质层切片,并能像其他宏观和/或微观特征一样进行统计测量。通过透射电子显微镜,它能在超过100,000倍的放大倍数下,清晰地观察到角质层各层和亚层的情况。自九十年代末以来(盖坦·吉尼亚尔,2019年),它已被有效地用于分类学、环境特征和进化研究等领域,然而,在此首次逐步详细介绍并加以说明。未来它可用于许多目的,如其他分类学比较、古重建和进化研究。该方案的价值•此方法可提供厚度为60至70纳米的超薄植物角质层切片•角质层各层和亚层的细节易于观察•大量切片可常规进行统计测量

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/99d2/8374509/98c81d91eb5d/fx1.jpg

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