Yang Guang, Gao Shang-Peng
Department of Materials Science, Fudan University, Shanghai 200433, P. R. China.
Yiwu Research Institute of Fudan University, Yiwu, Zhejiang 322000, P. R. China.
Nanoscale. 2021 Oct 21;13(40):17057-17067. doi: 10.1039/d1nr04896a.
Previous calculations of the dielectric and optical properties of 2D materials often overlooked or circumvented the influence of vacuum spacing introduced in periodic calculations, which gave rise to mispredictions of the intrinsic properties of 2D materials or merely qualitative results. We first elucidated the relationship between the vacuum spacing and the dielectric and optical properties of 2D materials in periodic calculations, and then formulated an effective method to accurately predict the dielectric and optical properties of 2D materials by restoring the intrinsic dielectric functions of 2D materials independent of the additional vacuum spacing. As examples, the intrinsic dielectric and optical properties of ultrathin hexagonal boron nitride (h-BN) and molybdenum sulphide (MoS) from a monolayer to a pentalayer, including dielectric functions, optical absorption coefficients, refraction indexes, reflectivities, extinction coefficients, and energy loss functions, have been calculated by our method. Our calculations reveal that the out-of-plane optical dielectric constants, static refraction indexes, and static reflectivities of 2D h-BN and MoS increase as the number of layers increases, while the in-plane counterparts remain unchanged. The excitonic frequency-dependent optical properties of h-BN and MoS from a monolayer to bulk are also calculated by solving the Bethe-Salpeter equation and they show strong anisotropy. The present method shows better agreement with the experimental results compared to previous calculations and demonstrates enormous potential to investigate the dielectric and optical properties of other 2D materials extensively and quantitatively.
先前对二维材料介电和光学性质的计算常常忽略或回避了周期性计算中引入的真空间距的影响,这导致了对二维材料本征性质的错误预测或仅仅得到定性结果。我们首先阐明了周期性计算中真空间距与二维材料介电和光学性质之间的关系,然后制定了一种有效方法,通过恢复与额外真空间距无关的二维材料本征介电函数,来准确预测二维材料的介电和光学性质。作为示例,我们用该方法计算了从单层到五层的超薄六方氮化硼(h-BN)和硫化钼(MoS)的本征介电和光学性质,包括介电函数、光吸收系数、折射率、反射率、消光系数和能量损失函数。我们的计算表明,二维h-BN和MoS的面外光学介电常数、静态折射率和静态反射率随着层数的增加而增大,而面内对应值保持不变。通过求解贝里 - 萨尔皮特方程,还计算了从单层到体相的h-BN和MoS的激子频率相关光学性质,它们表现出很强的各向异性。与先前的计算相比,本方法与实验结果显示出更好的一致性,并展示了广泛且定量研究其他二维材料介电和光学性质的巨大潜力。