Carrasco Ismael S S, Oliveira Tiago J
Instituto de Física, Universidade de Brasília, 70919-970, Brasília, DF, Brazil and Instituto de Física, Universidade Federal Fluminense, 24210-340 Niterói, RJ, Brazil.
Departamento de Física, Universidade Federal de Viçosa, 36570-900, Viçosa, MG, Brazil.
Phys Rev E. 2022 May;105(5-1):054804. doi: 10.1103/PhysRevE.105.054804.
Fundamental properties of an interface evolving on a domain of size L, such as its height distribution (HD) and two-point covariances, are known to assume universal but different forms depending on whether L is fixed (flat geometry) or expands linearly in time (radial growth). The interesting situation where L varies nonlinearly, however, is far less explored and it has never been tackled for two-dimensional (2D) interfaces. Here, we study discrete Kardar-Parisi-Zhang (KPZ) growth models deposited on square lattice substrates, whose (average) lateral size enlarges as L=L_{0}+ωt^{γ}. Our numerical simulations reveal that the competition between the substrate expansion and the increase of the correlation length parallel to the substrate, ξ≃ct^{1/z}, gives rise to a number of interesting results. For instance, when γ<1/z the interface becomes fully correlated, but its squared roughness, W_{2}, keeps increasing as W_{2}∼t^{2αγ}, as previously observed for one-dimensional (1D) systems. A careful analysis of this scaling, accounting for an intrinsic width on it, allows us to estimate the roughness exponent of the 2D KPZ class as α=0.387(1), which is very accurate and robust, once it was obtained averaging the exponents for different models and growth conditions (i.e., for various γ^{'}s and ω^{'}s). In this correlated regime, the HDs and covariances are consistent with those expected for the steady-state regime of the 2D KPZ class for flat geometry. For γ≈1/z, we find a family of distributions and covariances continuously interpolating between those for the steady-state and the growth regime of radial KPZ interfaces, as the ratio ω/c augments. When γ>1/z the system stays forever in the growth regime and the HDs always converge to the same asymptotic distribution, which is the one for the radial case. The spatial covariances, on the other hand, are (γ,ω)-dependent, showing a trend towards the covariance of a random deposition in enlarging substrates as the expansion rate increases. These results considerably generalize our understanding of the height fluctuations in 2D KPZ systems, revealing a scenario very similar to the one previously found in the 1D case.
已知在大小为(L)的区域上演化的界面的基本性质,例如其高度分布(HD)和两点协方差,会根据(L)是固定的(平面几何)还是随时间线性扩展(径向增长)而呈现出通用但不同的形式。然而,(L)非线性变化的有趣情况却很少被研究,并且从未针对二维(2D)界面进行过处理。在这里,我们研究沉积在方形晶格衬底上的离散 Kardar-Parisi-Zhang(KPZ)增长模型,其(平均)横向尺寸随着(L = L_0 + ωt^γ)增大。我们的数值模拟表明,衬底扩展与平行于衬底的相关长度(ξ≃ct^{1/z})的增加之间的竞争产生了许多有趣的结果。例如,当(γ < 1/z)时,界面变得完全相关,但其平方粗糙度(W_2)继续增加,如(W_2∼t^{2αγ}),这与之前在一维(1D)系统中观察到的情况相同。对这种标度进行仔细分析,并考虑其上的固有宽度,使我们能够估计二维 KPZ 类的粗糙度指数为(α = 0.387(1)),一旦对不同模型和生长条件(即各种(γ)和(ω))的指数进行平均,这个值就非常准确且稳健。在这种相关区域中,HD 和协方差与平面几何的二维 KPZ 类稳态区域预期的结果一致。对于(γ≈1/z),我们发现随着(ω/c)的增加,存在一族分布和协方差,它们在径向 KPZ 界面的稳态和生长区域之间连续插值。当(γ > 1/z)时,系统永远处于生长区域,HD 始终收敛到相同的渐近分布,即径向情况的分布。另一方面,空间协方差依赖于((γ,ω)),随着扩展速率的增加,显示出在扩大衬底中随机沉积协方差的趋势。这些结果极大地扩展了我们对二维 KPZ 系统中高度波动的理解,揭示了一种与之前在一维情况中发现的非常相似的情况。