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纳米级铁磁畴的磁力探针表征:有限元静磁模拟

Magnetic Force Probe Characterizations of Nanoscaled Ferromagnetic Domains: Finite-Element Magnetostatic Simulations.

作者信息

Zheng Xiao-Xia, Sun Wei-Feng

机构信息

College of Computer Science and Technology, Heilongjiang Institute of Technology, Harbin 150050, China.

School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798, Singapore.

出版信息

Nanomaterials (Basel). 2022 Jun 28;12(13):2212. doi: 10.3390/nano12132212.

Abstract

Microscopic characterization of magnetic nanomaterials by magnetic probe interacting with ferromagnetic nano-domains is proposed according to finite-element magnetostatic field simulations. Magnetic forces detected by microscopic probe are systematically investigated on magnetic moment orientation, magnetization intensity and geometry of ferromagnetic nano-domains, and especially on permanent magnetic coating thickness and tilting angle of probe, to provide a theoretical basis for developing magnetic force microscopy. Magnetic force direction is primarily determined by magnetic moment orientation of nanosample, and the tip curvature dominates magnetic force intensity that is meanwhile positively correlated with nanosample magnetization and probe magnetic coating thickness. Nanosample should reach a critical thickness determined by its transverse diameter to be capable of accurately detecting the magnetic properties of ferromagnetic nanomaterials. Magnetic force signal relies on probe inclination when the sample magnetic moment is along probe tilting direction, which, however, is not disturbed by probe inclination when sample magnetic moment is perpendicular to probe tilting plane. Within the geometry of satisfying a critical size requirement, the magnetic force can successfully image the ferromagnetic nano-domains by characterizing their sizes and magnetic moment orientations. The present study is expected to provide effective analyzing schemes and theoretical evidences for magnetic force microscopy of characterizing magnetic structures in ferromagnetic nanomaterials.

摘要

基于有限元静磁场模拟,提出了利用磁探针与铁磁纳米畴相互作用对磁性纳米材料进行微观表征的方法。系统研究了微观探针检测到的磁力与铁磁纳米畴的磁矩取向、磁化强度和几何形状的关系,特别是与永磁涂层厚度和探针倾斜角度的关系,为磁力显微镜的发展提供理论依据。磁力方向主要由纳米样品的磁矩取向决定,尖端曲率主导磁力强度,而磁力强度与纳米样品磁化强度和探针磁涂层厚度呈正相关。纳米样品应达到由其横向直径决定的临界厚度,才能准确检测铁磁纳米材料的磁性。当样品磁矩沿探针倾斜方向时,磁力信号依赖于探针倾斜度;然而,当样品磁矩垂直于探针倾斜平面时,磁力信号不受探针倾斜度的干扰。在满足临界尺寸要求的几何形状范围内,磁力可以通过表征铁磁纳米畴的尺寸和磁矩取向来成功成像。本研究有望为表征铁磁纳米材料中磁性结构的磁力显微镜提供有效的分析方案和理论依据。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9715/9268476/270fe086e58d/nanomaterials-12-02212-g001.jpg

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