Su Wei-Bin, Lu Shin-Ming, Jeng Horng-Tay, Chan Wen-Yuan, Chang Ho-Hsiang, Pai Woei Wu, Liu Hsiang-Lin, Chang Chia-Seng
Institute of Physics, Academia Sinica Nankang Taipei 11529 Taiwan
Department of Physics, National Tsing Hua University Hsinchu 30013 Taiwan
Nanoscale Adv. 2020 Nov 11;2(12):5848-5856. doi: 10.1039/d0na00682c. eCollection 2020 Dec 15.
We demonstrate that the linewidth of the field emission resonance (FER) observed on the surface of MoS using scanning tunneling microscopy can vary by up to one order of magnitude with an increasing electric field. This phenomenon originates from quantum trapping, in which the electron relaxed from a resonant electron in the FER is momentarily trapped in a potential well on the MoS surface due to its wave nature. Because the relaxed electron and the resonant electron have the same spin, through the action of the Pauli exclusion principle, the lifetimes of the resonant electrons can be substantially prolonged when the relaxed electrons engage in resonance trapping. The linewidth of the FER is thus considerably reduced to as narrow as 12 meV. The coexistence of the resonant electron and the relaxed electron requires the emission of two electrons, which can occur through the exchange interaction.
我们证明,使用扫描隧道显微镜在MoS表面观察到的场发射共振(FER)的线宽会随着电场的增加而变化高达一个数量级。这种现象源于量子捕获,其中从FER中的共振电子弛豫的电子由于其波动性而暂时被困在MoS表面的势阱中。由于弛豫电子和共振电子具有相同的自旋,通过泡利不相容原理的作用,当弛豫电子参与共振捕获时,共振电子的寿命可以显著延长。因此,FER的线宽大幅减小至窄至12毫电子伏特。共振电子和弛豫电子的共存需要发射两个电子,这可以通过交换相互作用发生。