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石墨烯上水的滑移长度的半透明性和负温度依赖性。

Translucency and negative temperature-dependence for the slip length of water on graphene.

作者信息

Li Han, Xu Zhi, Ma Chen, Ma Ming

机构信息

Department of Mechanical Engineering, State Key Laboratory of Tribology in Advanced Equipment (SKLT), Tsinghua University, Beijing 100084, China.

Center for Nano and Micro Mechanics, Tsinghua University, Beijing 100084, China.

出版信息

Nanoscale. 2022 Oct 13;14(39):14636-14644. doi: 10.1039/d2nr01481e.

Abstract

Carbonous materials, such as graphene and carbon nanotubes, have attracted tremendous attention in the fields of nanofluidics due to the slip at the interface between solid and liquid. The dependence of slip length for water on the types of supporting substrates and thickness of the carbonous layer, which is critical for applications such as sustainable cooling of electronic devices, remains unknown. In this paper, using colloidal probe atomic force microscopy, we measured the slip length of water on graphene supported by hydrophilic and hydrophobic substrates, , SiO and octadecyltrimethoxysilane (OTS). The on single-layer graphene supported by SiO is found to be 1.6 ± 1.9 nm, and that of OTS is 8.5 ± 0.9 nm. When the thickness of few-layer graphene increases to 3-4 layers, both values gradually converge to the value of graphite (4.3 ± 3.5 nm). Such a thickness dependence is termed slip length translucency. Further, is found to decrease by about 70% when temperature increases from 300 K to 350 K for 2-layer graphene supported by SiO. These observations are explained by analysis based on the Green-Kubo relation and McLachlan theory. Our results provide the first set of reference values for the slip length of water on supported few-layer graphene. They can not only serve as a direct experimental reference for solid-liquid interaction, but also provide a guideline for the design of nanofluidics-based devices, for example thermo-mechanical nanofluidic devices.

摘要

诸如石墨烯和碳纳米管之类的含碳材料,由于固液界面处的滑移现象,在纳米流体领域引起了极大关注。水的滑移长度对支撑基底类型和含碳层厚度的依赖性,对于诸如电子设备的可持续冷却等应用至关重要,但目前仍不清楚。在本文中,我们使用胶体探针原子力显微镜,测量了水在由亲水性和疏水性基底(SiO₂和十八烷基三甲氧基硅烷(OTS))支撑的石墨烯上的滑移长度。发现由SiO₂支撑的单层石墨烯上的滑移长度为1.6±1.9纳米,OTS支撑的单层石墨烯上的滑移长度为8.5±0.9纳米。当少层石墨烯的厚度增加到3 - 4层时,两个滑移长度值逐渐收敛到石墨的值(4.3±3.5纳米)。这种厚度依赖性被称为滑移长度半透明性。此外,对于由SiO₂支撑的双层石墨烯,当温度从300 K升高到350 K时,滑移长度发现减少了约70%。基于格林 - 库博关系和麦克拉克伦理论的分析解释了这些观察结果。我们的结果提供了关于支撑的少层石墨烯上水的滑移长度的第一组参考值。它们不仅可以作为固液相互作用的直接实验参考,还可以为基于纳米流体的设备(例如热机械纳米流体设备)的设计提供指导。

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