Zhao Xiaofang, Wang Tao, Sheng Bowen, Zheng Xiantong, Chen Li, Liu Haihui, He Chao, Xu Jun, Zhu Rui, Wang Xinqiang
School of Materials Science and Engineering, Tiangong University, Tianjin 300387, China.
Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China.
Nanomaterials (Basel). 2022 Oct 23;12(21):3719. doi: 10.3390/nano12213719.
InGaN materials are widely used in optoelectronic devices due to their excellent optical properties. Since the emission wavelength of the full-composition-graded InGaN films perfectly matches the solar spectrum, providing a full-spectrum response, this makes them suitable for the manufacturing of high-efficiency optoelectronic devices. It is extremely important to study the optical properties of materials, but there are very few studies of the luminescence of full-composition-graded InGaN ternary alloy. In this work, the optical properties of full-composition-graded InGaN films are studied by cathodoluminescence (CL). The CL spectra with multiple luminescence peaks in the range of 365-1000 nm were acquired in the cross-sectional and plan-view directions. The CL spectroscopy studies were carried out inside and outside of microplates formed under the indium droplets on the InGaN surface, which found that the intensity of the light emission peaks inside and outside of microplates differed significantly. Additionally, the paired defects structure is studied by using the spectroscopic method. A detailed CL spectroscopy study paves the way for the growth and device optimization of high-quality, full-composition-graded InGaN ternary alloy materials.
由于其优异的光学性能,氮化铟镓(InGaN)材料在光电器件中得到了广泛应用。由于全成分渐变InGaN薄膜的发射波长与太阳光谱完美匹配,能提供全光谱响应,这使得它们适用于制造高效光电器件。研究材料的光学性质极其重要,但对全成分渐变InGaN三元合金发光的研究却非常少。在这项工作中,通过阴极发光(CL)研究了全成分渐变InGaN薄膜的光学性质。在横截面和平面视图方向上获得了365 - 1000 nm范围内具有多个发光峰的CL光谱。在InGaN表面铟滴下形成的微孔板内外进行了CL光谱研究,发现微孔板内外发光峰的强度有显著差异。此外,采用光谱方法研究了配对缺陷结构。详细的CL光谱研究为高质量、全成分渐变InGaN三元合金材料的生长和器件优化铺平了道路。