透射电子显微镜图像中纳米颗粒尺寸分布的精确分析

Precise Analysis of Nanoparticle Size Distribution in TEM Image.

作者信息

Zhang Shan, Wang Chao

机构信息

School of Materials Science and Engineering, Institute of Materials Science and Devices, Suzhou University of Science and Technology, 99 Xuefu Road, Suzhou 215011, China.

The Russell H. Morgan Department of Radiology and Radiological Science, The Johns Hopkins University School of Medicine, 733 N. Broadway, Baltimore, MD 21218, USA.

出版信息

Methods Protoc. 2023 Jul 3;6(4):63. doi: 10.3390/mps6040063.

DOI:10.3390/mps6040063

PMID:37489430

原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC10366915/

Abstract

As an essential characterization, size distribution is an important indicator for the synthesis, optimization, and application of nanoparticles. Electron microscopes such as transmission electron microscopes (TEMs) are commonly utilized to collect size information on nanoparticles. However, the current popular statistical method of manually measuring large particles one by one, using a ruler tool in the corresponding image analysis software is time-consuming and can introduce manual errors. Moreover, it is difficult to determine the measurement interval for irregularly shaped nanoparticles. Therefore, it is necessary to use an efficient and standard method to perform size distribution analysis of nanoparticles. In this work, we use basic software (1.53 t) to analyze the size of typical silica nanoparticles in a TEM image and use software to process the data, to obtain its accurate distribution quickly. Using it as a template, we believe that this work can provide a paradigm for the standardized analysis of nanoparticle size.

摘要

作为一项基本特征，尺寸分布是纳米颗粒合成、优化及应用的重要指标。诸如透射电子显微镜（TEM）之类的电子显微镜通常用于收集纳米颗粒的尺寸信息。然而，当前流行的统计方法是在相应的图像分析软件中使用标尺工具逐一手动测量大颗粒，这种方法既耗时又可能引入人为误差。此外，对于形状不规则的纳米颗粒，很难确定测量间隔。因此，有必要采用一种高效且标准的方法来进行纳米颗粒的尺寸分布分析。在这项工作中，我们使用基础软件（1.53 t）来分析透射电子显微镜图像中典型二氧化硅纳米颗粒的尺寸，并使用软件处理数据，以快速获得其准确分布。以此作为模板，我们相信这项工作可为纳米颗粒尺寸的标准化分析提供范例。