Guckel Jannik, Görke Marion, Garnweitner Georg, Park Daesung
Physikalisch-Technische Bundesanstalt, Bundesallee 100, Braunschweig 38116, Germany.
Laboratory of Emerging Nanometrology (LENA), Langer Kamp 6, 38106 Braunschweig, Germany.
Microsc Microanal. 2023 Jun 9;29(3):1062-1070. doi: 10.1093/micmic/ozad036.
The size of nanoparticles is a critical parameter with regard to their performance. Therefore, precise measurement of the size distribution is often required. While electron microscopy (EM) is a useful tool to image large numbers of particles at once, manual analysis of individual particles in EM images is a time-consuming and labor-intensive task. Therefore, reliable automatic detection methods have long been desired. This paper introduces a novel automatic particle analysis software package based on the circular Hough transform (CHT). Our software package includes novel features to enhance precise particle analysis capabilities. We applied the CHT algorithm in an iterative workflow, which ensures optimal detection over wide radius intervals, to deal with overlapping particles. In addition, smart intensity criteria were implemented to resolve common difficult cases that lead to false particle detection. Implementing these criteria enabled an effective and precise analysis by minimizing detection of false particles. Overall, our approach showed reliable particle analysis results by resolving common types of particle overlaps and deformation with only negligible errors.
纳米颗粒的尺寸是关乎其性能的关键参数。因此,常常需要精确测量尺寸分布。虽然电子显微镜(EM)是一次性成像大量颗粒的有用工具,但对EM图像中的单个颗粒进行手动分析是一项耗时且费力的任务。因此,长期以来一直需要可靠的自动检测方法。本文介绍了一种基于圆形霍夫变换(CHT)的新型自动颗粒分析软件包。我们的软件包具有增强精确颗粒分析能力的新特性。我们将CHT算法应用于迭代工作流程中,该流程可确保在宽半径区间内实现最佳检测,以处理重叠颗粒。此外,还实施了智能强度标准来解决导致错误颗粒检测的常见难题。实施这些标准能够通过最小化错误颗粒的检测实现有效且精确的分析。总体而言,我们的方法通过解决常见类型的颗粒重叠和变形问题,仅产生可忽略不计的误差,从而显示出可靠的颗粒分析结果。