Center for Food Safety and Applied Nutrition (CFSAN), U.S. Food and Drug Administration, College Park, MD, USA.
Chemical Science Division, Material Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA.
Food Addit Contam Part A Chem Anal Control Expo Risk Assess. 2024 Jan;41(1):9-21. doi: 10.1080/19440049.2023.2297420. Epub 2024 Jan 17.
Silicon dioxide (SiO), in its amorphous form, is an approved direct food additive in the United States and has been used as an anticaking agent in powdered food products and as a stabilizer in the production of beer. While SiO has been used in food for many years, there is limited information regarding its particle size and size distribution. In recent years, the use of SiO food additive has raised attention because of the possible presence of nanoparticles. Characterization of SiO food additive and understanding their physicochemical properties utilizing modern analytical tools are important in the safety evaluation of this additive. Herein, we present analytical techniques to characterize some SiO food additives, which were obtained directly from manufacturers and distributors. Characterization of these additives was performed using dynamic light scattering (DLS), transmission electron microscopy (TEM), field emission scanning electron microscopy (FE-SEM), and single-particle inductively coupled plasma mass spectrometry (spICP-MS) after the food additive materials underwent different experimental conditions. The data obtained from DLS, spICP-MS, and electron microscopy confirmed the presence of nanosized (1-100 nm) primary particles, as well as aggregates and agglomerates of aggregates with sizes greater than 100 nm. SEM images demonstrated that most of the SiO food additives procured from different distributors showed similar morphology. The results provide a foundation for evaluating the nanomaterial content of regulated food additives and will help the FDA address current knowledge gaps in analyzing nanosized particles in commercial food additives.
二氧化硅(SiO)呈无定形状态,是美国批准的直接食品添加剂,已被用作粉状食品的抗结块剂和啤酒生产中的稳定剂。虽然 SiO 多年来一直用于食品,但关于其粒径和粒径分布的信息有限。近年来,由于可能存在纳米颗粒,SiO 食品添加剂的使用引起了人们的关注。利用现代分析工具对 SiO 食品添加剂进行特性描述并了解其物理化学性质,对于该添加剂的安全性评估非常重要。本文介绍了用于表征一些 SiO 食品添加剂的分析技术,这些添加剂是直接从制造商和分销商处获得的。对这些添加剂进行了特性描述,使用了动态光散射(DLS)、透射电子显微镜(TEM)、场发射扫描电子显微镜(FE-SEM)和单颗粒电感耦合等离子体质谱(spICP-MS),在对食品添加剂材料进行不同实验条件处理后进行。DLS、spICP-MS 和电子显微镜获得的数据证实了纳米级(1-100nm)初级颗粒的存在,以及大于 100nm 的团聚体和团聚体的聚集物。SEM 图像表明,从不同分销商处获得的大多数 SiO 食品添加剂显示出相似的形态。研究结果为评估受监管食品添加剂中的纳米材料含量提供了基础,并将帮助 FDA 解决当前在分析商业食品添加剂中的纳米颗粒方面的知识空白。