Ansari Meenhaz, Ashraf S S Z, Tripathi P, Ahmad A
Interdisciplinary Nanotechnology Centre, Zakir Husain College of Engineering and Technology, Aligarh Muslim University, Aligarh 202002, Uttar Pradesh, India.
Department of Physics, Faculty of Science, Aligarh Muslim University, Aligarh 202002, Uttar Pradesh, India.
J Phys Condens Matter. 2024 May 8;36(31). doi: 10.1088/1361-648X/ad42ed.
We have performed a comprehensive numerical and analytical examination of two crucial transport aspects in silicene: the phonon-drag thermopower,Sp, and the electron's energy loss rate,Fe. Specifically, our investigation is centered on their responses to out-of-plane flexural phonons and in-plane acoustic phonons in silicene, a two-dimensional allotrope of silicon as a function of electron temperature,T,and electron concentration,n,upto the room temperature. It is found that the calculated quantities have a non-monotonic dependence for the phonon modes for both parameters(T and n)considered while analytical results predict definite dependencies up to the complete low-temperature Bloch-Gruneisen (BG) regime. To provide a more comprehensive picture, we contrast the complete numerical outcomes with the approximated analytical BG results, revealing a convergence within a specific range of temperature and carrier concentration. In light of this convergence, we put forth suggestions to elucidate the underlying factors responsible for this behavior. A comparison based on the magnitude of the calculated quantities can be made from the figures between the two considered phonon modes, which clearly shows that the out-of-plane flexural phonons are effective throughout the considered temperature range. This observation leads us to posit that the dominating contribution of the out-of-plane flexural phonon modes hinges upon the deformation potential constant and phonon energy associated with the phonon mode. Our study carries significant implications for estimating the electrical and thermal properties of silicene and provides valuable insights for the development of devices based on silicene-based technologies.
声子拖拽热功率(S_p)和电子能量损失率(F_e)。具体而言,我们的研究聚焦于它们对硅烯(硅的二维同素异形体)中的面外弯曲声子和面内声学声子的响应,这些响应是电子温度(T)和电子浓度(n)的函数,直至室温。研究发现,对于所考虑的两个参数((T)和(n)),计算得到的量对声子模式具有非单调依赖性,而分析结果预测在完整的低温布洛赫 - 格律恩森(BG)区域内具有确定的依赖性。为了提供更全面的图景,我们将完整的数值结果与近似的分析BG结果进行对比,揭示了在特定温度和载流子浓度范围内的收敛性。鉴于这种收敛性,我们提出建议以阐明导致这种行为的潜在因素。基于计算量的大小,可以从两个所考虑的声子模式之间的图中进行比较,这清楚地表明面外弯曲声子在整个考虑的温度范围内都是有效的。这一观察结果使我们推测,面外弯曲声子模式的主导贡献取决于与声子模式相关的形变势常数和声子能量。我们的研究对估计硅烯的电学和热学性质具有重要意义,并为基于硅烯技术的器件开发提供了有价值的见解。