Hsu Chao-Chun, Hsu Allen Chu-Hsiang, Lin Chun-Yen, Wong Ken-Tsung, Bonn Daniel, Brouwer Albert M
van 't Hoff Institute for Molecular Sciences, University of Amsterdam, Science Park 904, 1098 XH Amsterdam, The Netherlands.
Department of Chemistry, National Taiwan University, and Institute of Atomic and Molecular Science, Academia Sinica, Taipei 10617, Taiwan.
J Am Chem Soc. 2024 May 15;146(19):13258-13265. doi: 10.1021/jacs.4c01312. Epub 2024 May 2.
Obtaining insights into friction at the nanoscopic level and being able to translate these into macroscopic friction behavior in real-world systems is of paramount importance in many contexts, ranging from transportation to high-precision technology and seismology. Since friction is controlled by the local pressure at the contact it is important to be able to detect both the real contact area and the nanoscopic local pressure distribution simultaneously. In this paper, we present a method that uses planarizable molecular probes in combination with fluorescence microscopy to achieve this goal. These probes, inherently twisted in their ground states, undergo planarization under the influence of pressure, leading to bathochromic and hyperchromic shifts of their UV-vis absorption band. This allows us to map the local pressure in mechanical contact from fluorescence by exciting the emission in the long-wavelength region of the absorption band. We demonstrate a linear relationship between fluorescence intensity and (simulated) pressure at the submicron scale. This relationship enables us to experimentally depict the pressure distribution in multiasperity contacts. The method presented here offers a new way of bridging friction studies of the nanoscale model systems and practical situations for which surface roughness plays a crucial role.
在从交通运输到高精度技术和地震学等许多领域中,深入了解纳米尺度下的摩擦力并能够将其转化为实际系统中的宏观摩擦行为至关重要。由于摩擦力由接触处的局部压力控制,因此能够同时检测真实接触面积和纳米尺度下的局部压力分布非常重要。在本文中,我们提出了一种方法,该方法使用可平面化的分子探针结合荧光显微镜来实现这一目标。这些探针在基态时固有扭曲,在压力影响下会发生平面化,导致其紫外可见吸收带出现红移和增色位移。这使我们能够通过激发吸收带长波长区域的发射,从荧光中映射机械接触中的局部压力。我们证明了在亚微米尺度下荧光强度与(模拟)压力之间存在线性关系。这种关系使我们能够通过实验描绘多粗糙接触中的压力分布。本文提出的方法为弥合纳米尺度模型系统的摩擦研究与表面粗糙度起关键作用的实际情况之间的差距提供了一种新途径。