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通过溶液锗合金化提高硫系太阳能电池的性能。

Improving the performance of kesterite solar cells by solution germanium alloying.

作者信息

Xiang Sitong, Li Yize, Xiang Chunxu, Liu Hongkun, Zheng Yuanyuan, Wang Shaoying, Yan Weibo, Xin Hao

机构信息

State Key Laboratory for Organic Electronics and Information Displays, College of Chemistry and Life Sciences, Institute of Advanced Materials (IAM), Nanjing University of Posts & Telecommunications, 9 Wenyuan Road, Nanjing 210023, China.

出版信息

Phys Chem Chem Phys. 2024 Jul 31;26(30):20645-20652. doi: 10.1039/d4cp02398f.

Abstract

Cation substitution is an effective strategy to regulate the defects/electronic properties of kesterite CuZnSn(S,Se) (CZTSSe) absorbers and improve the device photovoltaic performance. Here, we report Ge alloying kesterite CuZn(Sn,Ge)(S,Se) (CZTGSSe) a solution approach. The results demonstrate that the same chemical reaction of Ge to Sn ensures homogeneous Ge incorporation in the whole range of concentrations (from 0 to unit). Ge alloying promotes grain growth and linearly enlarges the absorber band gap by solely raising the conduction band minimum, which maintains a "spike" conduction band offset at the heterojunction interface until 15% alloying concentration and thus facilitates effective charge carrier collection. A promising efficiency of 11.57% has been achieved at 15% Ge alloying concentration with a significant enhancement in open-circuit voltage and fill factor. By further 10% Ag alloying to improve the absorber film morphology, a champion device with an efficiency of 12.25% has been achieved without an antireflective coating. This result emphasizes the feasibility of achieving homogeneous and controllable Ge alloying of kesterite semiconductors through the solution method, paving the way for further improvement and optimization of device performance.

摘要

阳离子取代是调节锡锌黄铁矿CuZnSn(S,Se)(CZTSSe)吸收体的缺陷/电子特性并提高器件光伏性能的有效策略。在此,我们报道了一种通过溶液法制备锗合金化的锡锌黄铁矿CuZn(Sn,Ge)(S,Se)(CZTGSSe)的方法。结果表明,锗与锡的化学反应相同,确保了锗在整个浓度范围内(从0到单位浓度)均匀掺入。锗合金化促进晶粒生长,并通过仅提高导带最小值来线性扩大吸收体的带隙,在15%的合金化浓度之前,在异质结界面处保持“尖峰”导带偏移,从而有利于有效的电荷载流子收集。在15%的锗合金化浓度下,实现了11.57%的可观效率,开路电压和填充因子显著提高。通过进一步10%的银合金化来改善吸收体薄膜的形貌,在没有抗反射涂层的情况下,实现了效率为12.25%的最优器件。这一结果强调了通过溶液法实现锡锌黄铁矿半导体均匀可控锗合金化的可行性,为进一步提高和优化器件性能铺平了道路。

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