Biophysics Graduate Program, University of California, Davis, CA 95618, USA.
Department of Neurology, University of California, Davis, CA 95618, USA.
Int J Mol Sci. 2024 Jul 16;25(14):7796. doi: 10.3390/ijms25147796.
The opening of the CLC-0 chloride (Cl) channel is known to be regulated by two gating mechanisms: fast gating and slow (common) gating. The structural basis underlying the fast-gating mechanism is better understood than that of the slow-gating mechanism, which is still largely a mystery. Our previous study on the intracellular proton (H)-induced inhibition of the CLC-0 anionic current led to the conclusion that the inhibition results from the slow-gate closure (also called inactivation). The conclusion was made based on substantial evidence such as a large temperature dependence of the H inhibition similar to that of the channel inactivation, a resistance to the H inhibition in the inactivation-suppressed C212S mutant, and a similar voltage dependence between the current recovery from the H inhibition and the recovery from the channel inactivation. In this work, we further examine the mechanism of the H inhibition of wild-type CLC-0 and several mutants. We observe that an anion efflux through the pore of CLC-0 accelerates the recovery from the H-induced inhibition, a process corresponding to the slow-gate opening. Furthermore, various inactivation-suppressed mutants exhibit different current recovery kinetics, suggesting the existence of multiple inactivated states (namely, slow-gate closed states). We speculate that protonation of the pore of CLC-0 increases the binding affinity of permeant anions in the pore, thereby generating a pore blockage of ion flow as the first step of inactivation. Subsequent complex protein conformational changes further transition the CLC-0 channel to deeper inactivated states.
CLC-0 氯离子 (Cl) 通道的开启受两种门控机制调控:快速门控和慢速(常见)门控。快速门控机制的结构基础比慢速门控机制更为人所理解,后者在很大程度上仍是个谜。我们之前关于细胞内质子 (H) 诱导抑制 CLC-0 阴离子电流的研究得出结论,抑制作用是由于慢速门关闭(也称为失活)。该结论是基于大量证据得出的,例如 H 抑制的温度依赖性与通道失活的温度依赖性非常相似、在失活抑制的 C212S 突变体中对 H 抑制的抵抗力以及电流从 H 抑制中恢复的电压依赖性与通道失活的电压依赖性相似。在这项工作中,我们进一步研究了野生型 CLC-0 和几种突变体的 H 抑制机制。我们观察到 CLC-0 孔中的阴离子流出加速了从 H 诱导的抑制中恢复,这一过程对应于慢速门的打开。此外,各种失活抑制突变体表现出不同的电流恢复动力学,表明存在多种失活状态(即,慢速门关闭状态)。我们推测 CLC-0 孔中的质子化增加了孔中可渗透阴离子的结合亲和力,从而产生离子流的孔阻塞,作为失活的第一步。随后的复杂蛋白构象变化进一步将 CLC-0 通道转变为更深的失活状态。