Soncini Cristian, Costantini Roberto, Dell'Angela Martina, Morgante Alberto, Pedio Maddalena
CNR-Istituto Officina dei Materiali (IOM), S.S. 14 km 163.5, 34149 Trieste, Italy.
Elettra Sincrotrone Trieste S.C.p.A., S.S. 14 km 163.5, 34149 Trieste, Italy.
Nanomaterials (Basel). 2025 Jan 21;15(3):154. doi: 10.3390/nano15030154.
The interfacial energy level alignment in the copper phthalocyanine/SiO/p-Si(100) heterojunction has been studied in dark conditions and under illumination. The element-sensitivity of the time-resolved X-ray photoemission provides a real-time picture of the photoexcited carrier dynamics at the interface and within the film, enabling one to distinguish between substrate and molecular contributions. We observe a molecule-to-substrate charge transfer under photoexcitation, which is directly related to the transient modification of the band bending in the substrate due to the surface photovoltage effect. Our results show that charge generation in the heterojunction is driven by the molecular layer in contact with the substrate. The different molecular orientation at the interface creates a new channel for charge injection in the substrate under photoexcitation.
在黑暗条件下和光照条件下,对铜酞菁/SiO/p-Si(100)异质结中的界面能级排列进行了研究。时间分辨X射线光电子能谱的元素敏感性提供了界面处和薄膜内光激发载流子动力学的实时图像,使人们能够区分衬底和分子的贡献。我们观察到光激发下分子到衬底的电荷转移,这与表面光电压效应导致的衬底中能带弯曲的瞬态变化直接相关。我们的结果表明,异质结中的电荷产生是由与衬底接触的分子层驱动的。界面处不同的分子取向在光激发下为电荷注入衬底创造了一个新通道。