Qin Laixiang, Wang Li
Ningbo Institute of Digital Twin, Eastern Institute of Technology, Ningbo City, 315100, Zhejiang, People's Republic of China.
Eastern Institute of Technology, Ningbo City, 315100, Zhejiang, People's Republic of China.
Nanomicro Lett. 2025 May 13;17(1):255. doi: 10.1007/s40820-025-01769-2.
The relentless down-scaling of electronics grands the modern integrated circuits (ICs) with the high speed, low power dissipation and low cost, fulfilling diverse demands of modern life. Whereas, with the semiconductor industry entering into sub-10 nm technology nodes, degrading device performance and increasing power consumption give rise to insurmountable roadblocks confronted by modern ICs that need to be conquered to sustain the Moore law's life. Bulk semiconductors like prevalent Si are plagued by seriously degraded carrier mobility as thickness thinning down to sub-5 nm, which is imperative to maintain sufficient gate electrostatic controllability to combat the increasingly degraded short channel effects. Nowadays, the emergence of two-dimensional (2D) materials opens up new gateway to eschew the hurdles laid in front of the scaling trend of modern IC, mainly ascribed to their ultimately atomic thickness, capability to maintain carrier mobility with thickness thinning down, dangling-bonds free surface, wide bandgaps tunability and feasibility to constitute diverse heterostructures. Blossoming breakthroughs in discrete electronic device, such as contact engineering, dielectric integration and vigorous channel-length scaling, or large circuits arrays, as boosted yields, improved variations and full-functioned processor fabrication, based on 2D materials have been achieved nowadays, facilitating 2D materials to step under the spotlight of IC industry to be treated as the most potential future successor or complementary counterpart of incumbent Si to further sustain the down-scaling of modern IC.
电子器件不断缩小的规模赋予了现代集成电路(IC)高速、低功耗和低成本的特性,满足了现代生活的各种需求。然而,随着半导体行业进入低于10纳米的技术节点,器件性能的下降和功耗的增加给现代IC带来了难以克服的障碍,要维持摩尔定律的寿命就必须克服这些障碍。像常见的硅这样的体半导体,当厚度减薄到亚5纳米时,载流子迁移率会严重下降,而保持足够的栅极静电可控性以应对日益严重的短沟道效应是至关重要的。如今,二维(2D)材料的出现为避开现代IC缩放趋势面前的障碍开辟了新途径,这主要归因于其最终的原子厚度、随着厚度减薄仍能保持载流子迁移率的能力、无悬挂键表面、宽带隙可调性以及构成各种异质结构的可行性。如今,基于二维材料在离散电子器件方面取得了蓬勃的突破,如接触工程、介质集成和积极的沟道长度缩放,或者在大型电路阵列方面,如提高产量、改善变化性和制造全功能处理器,这使得二维材料成为IC行业的焦点,被视为现有硅最具潜力的未来继任者或互补对象,以进一步维持现代IC的缩放。