Salman Muhammad Umar, Mehak Muhammad, Ali Umair, Din Ghulam Moin U, Ramay Shahid M, Younis M, Atiq Shahid
Centre of Excellence in Solid State Physics, University of the Punjab Lahore-54590 Pakistan
Physics and Astronomy Department, College of Science, King Saud University P.O. Box 2455 Riyadh 11451 Saudi Arabia.
RSC Adv. 2025 May 12;15(20):15618-15629. doi: 10.1039/d5ra01868d.
In this study, a 1D perovskite-based solar cell was simulated using COMSOL, incorporating CHNHGeI (organic in-organic hybrid) as an absorber layer, SnO as the electron transport layer (ETL), and CuTe as the hole transport layer (HTL). The simulations reveal that reducing the ETL's thickness enhances current density (), although the maximum output power ( ) diminishes with ETL's thickness. Conversely, increasing the absorber layer's thickness boosts open-circuit voltage ( ) and efficiency, exhibiting direct relation between and quasi-Fermi level splitting. Furthermore, variations in HTL thickness do not significantly affect or . Notably, and both increase with acceptor density, conversely, increase in donor density leads to declines in both and . While extending the electron-hole (e-h) lifetime within the ETL results in marginal efficiency improvements, significant enhancements in the e-h lifetime within the absorber layer substantially improve performance. However, the efficiency remains unaffected by variations in the e-h lifetime of the HTL. Additionally, higher operating temperatures adversely impact device performance, reducing , , , fill factor, and overall efficiency. This study provides critical insights into optimizing material properties and device parameters for experimental applications, underscoring the potential of CHNHGeI-based perovskites as viable candidates for next-generation photovoltaic technologies.
在本研究中,使用COMSOL模拟了一维钙钛矿基太阳能电池,其中包含CHNHGeI(有机-无机杂化材料)作为吸收层,SnO作为电子传输层(ETL),CuTe作为空穴传输层(HTL)。模拟结果表明,减小ETL的厚度会提高电流密度(),尽管最大输出功率()会随着ETL厚度的减小而降低。相反,增加吸收层的厚度会提高开路电压()和效率,显示出与准费米能级分裂之间的直接关系。此外,HTL厚度的变化对或没有显著影响。值得注意的是,和都随着受体密度的增加而增加,相反,施主密度的增加会导致和都下降。虽然延长ETL内的电子-空穴(e-h)寿命会使效率略有提高,但吸收层内e-h寿命的显著延长会大幅提高性能。然而,HTL的e-h寿命变化对效率没有影响。此外,较高的工作温度会对器件性能产生不利影响,降低、、、填充因子和整体效率。本研究为实验应用中优化材料性能和器件参数提供了关键见解,强调了基于CHNHGeI的钙钛矿作为下一代光伏技术可行候选材料的潜力。