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小麦旗叶光合电子传递对黑暗诱导衰老的差异敏感性

Differential Sensitivity of Photosynthetic Electron Transport to Dark-Induced Senescence in Wheat Flag Leaves.

作者信息

Yang Cheng, Du Simeng, Shi Yanhua, Zhang Deqi, Yue Junqin, Li Xiangdong, Jin Haiyang, Fang Baoting, Wei Fang, Zhang Zishan, Yan Ge

机构信息

Wheat Research Institute, Henan Academy of Agricultural Sciences, Postgraduate T&R Base of Zhengzhou University, Zhengzhou, 450002, China.

School of Agricultural Sciences, Zhengzhou University, Zhengzhou, 450002, China.

出版信息

BMC Plant Biol. 2025 May 16;25(1):650. doi: 10.1186/s12870-025-06624-5.

Abstract

BACKGROUND

In winter wheat (Triticum aestivum), delayed senescence of the flag leaf is linked to the duration of photosynthesis and grain yield. In different wheat cultivars, various components of the photosynthetic apparatus may display differences during senescence. Furthermore, previous studies related to senescence mostly used a limited number of cultivars, making it difficult to investigate the patterns and reasons for different appearance of damage to electron transport among various cultivars.To tackle these challenges, flag leaves of 32 wheat cultivars were subjected to darkness in vitro to simulate the senescence process. The cultivars were divided into three groups by k-means clustering, based on the rate of decline in their leaf chlorophyll content. Subsequently, we simultaneously measured prompt chlorophyll a fluorescence, delayed chlorophyll a fluorescence, and modulated 820-nm light reflection to examine the alterations in photosynthetic electron transport within the three groups of wheat cultivars during dark-induced senescence.

RESULTS

The results showed that the photosystem II (PSII) donor side, grouping of PSII units, PSII reaction center, PSII acceptor side, and photosystem I (PSI) were all damaged during dark-induced senescence, while the sensitivity of photosynthetic electron transport to senescence gradually increased from the upstream to downstream electron carriers on the PSII acceptor side. The extent of the observed decrease in activity of the different components of the photosynthetic electron transport chain during senescence, was consistent with the chlorophyll degradation rate of the wheat cultivars, while the priority of inhibition for different photosynthetic electron transport processes in each cultivar group was different. The results from the three separate signals align well with each other.

CONCLUSIONS

The sensitivity of different part of photosynthetic electron transport to senescence were varied depended on their chlorophyll degradation rate. The differences in the response of different processes of photosynthetic electron transport to chlorophyll degradation rates might be an important factor influencing the differences in photoinhibition among wheat cultivars, especially in senescence process.

摘要

背景

在冬小麦(普通小麦)中,旗叶的延迟衰老与光合作用持续时间和籽粒产量相关。在不同的小麦品种中,光合器官的各个组成部分在衰老过程中可能会表现出差异。此外,以往关于衰老的研究大多使用数量有限的品种,这使得难以探究不同品种间电子传递损伤表现差异的模式及原因。为应对这些挑战,对32个小麦品种的旗叶进行离体黑暗处理以模拟衰老过程。根据叶片叶绿素含量下降速率,通过K均值聚类将这些品种分为三组。随后,同时测量快速叶绿素a荧光、延迟叶绿素a荧光和820nm调制光反射,以研究三组小麦品种在黑暗诱导衰老过程中光合电子传递的变化。

结果

结果表明,在黑暗诱导衰老过程中,光系统II(PSII)供体侧、PSII单元的分组、PSII反应中心、PSII受体侧和光系统I(PSI)均受到损伤,而光合电子传递对衰老的敏感性从PSII受体侧的上游电子载体到下游电子载体逐渐增加。衰老过程中光合电子传递链不同组分活性下降的程度与小麦品种的叶绿素降解速率一致,而每个品种组中不同光合电子传递过程的抑制优先级不同。三个独立信号的结果相互吻合良好。

结论

光合电子传递的不同部分对衰老的敏感性因其叶绿素降解速率而异。光合电子传递不同过程对叶绿素降解速率响应的差异可能是影响小麦品种间光抑制差异的重要因素,尤其是在衰老过程中。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/18aa/12082866/33ba274ea754/12870_2025_6624_Fig1_HTML.jpg

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