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[使用镜面显微镜检查角膜上皮]

[Examination of the corneal epithelium using the specular microscope].

作者信息

Marechal-Courtois C, Delcourt J C

出版信息

J Fr Ophtalmol. 1983;6(6-7):639-46.

PMID:6663035
Abstract

Corneal epithelium examinations were conducted using the Pocklington specular microscope. Fifty cornea were observed and photographed. The most superficial corneal epithelium layer is seen with difficulty as the cells lack sufficient contrast. Epithelial lesions are easier to detect because cellular reflection is more marked. Injured cells are larger, and brighter, and their nucleus is more often visible. Subepithelial deposits can be recognized.

摘要

使用波克林顿镜面显微镜进行角膜上皮检查。观察并拍摄了50只角膜。由于细胞缺乏足够的对比度,很难看到最表层的角膜上皮层。上皮病变更容易检测,因为细胞反射更明显。受损细胞更大、更亮,其细胞核更常可见。可以识别上皮下沉积物。

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