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用于扫描显微镜的相衬与荧光数字自动对焦比较

Comparison of phase-contrast and fluorescence digital autofocus for scanning microscopy.

作者信息

Price J H, Gough D A

机构信息

Department of Bioengineering, University of California, San Diego, La Jolla 92093-0412.

出版信息

Cytometry. 1994 Aug 1;16(4):283-97. doi: 10.1002/cyto.990160402.

Abstract

Reliable autofocus is required to obtain accurate measurements of fluorescent stained cellular components from a system capable of scanning multiple microscope fields. Autofocus could be performed directly with fluorescence images, but due to photobleaching and destructive fluorescence by-products, it is best to minimize fluorescence exposure for photosensitive specimens and live cells. This exposure problem could be completely avoided by using phase-contrast microscopy, implemented through the same optics as fluorescence microscopy. The purpose of this work was to evaluate functions for both phase-contrast and fluorescence autofocus and determine the suitability of phase-contrast autofocus for fluorescence microscopy. Eleven autofocus functions were independently evaluated for fluorescence and phase-contrast microscopy. The most suitable functions were then chosen from these and phase-contrast and fluorescence autofocus were compared on scans each comprising more than 1,000 microscope fields. Autofocus standard deviation (S.D.) of better than 100 nm was achieved for both phase contrast and fluorescence. There was a measurable difference between the best focus positions in the two modes, but the difference was constant enough to be measured and corrected, suggesting the possibility of using phase contrast to predict best focus in fluorescence microscopy. The scanning experiments also showed that autofocus can be performed at least as fast as 0.25 s/field without loss of precision.

摘要

要从能够扫描多个显微镜视野的系统中获得荧光染色细胞成分的准确测量结果,就需要可靠的自动聚焦。自动聚焦可以直接对荧光图像进行,但由于光漂白和荧光副产物的破坏性影响,对于光敏标本和活细胞,最好尽量减少荧光曝光。通过与荧光显微镜相同的光学系统实现的相差显微镜可以完全避免这个曝光问题。这项工作的目的是评估相差和荧光自动聚焦的功能,并确定相差自动聚焦在荧光显微镜中的适用性。对相差显微镜和荧光显微镜的11种自动聚焦功能进行了独立评估。然后从这些功能中选出最合适的,并在每次包含超过1000个显微镜视野的扫描中比较相差和荧光自动聚焦。相差和荧光自动聚焦的标准偏差(S.D.)均优于100纳米。两种模式下的最佳聚焦位置之间存在可测量的差异,但该差异足够恒定,可以测量和校正,这表明在荧光显微镜中使用相差来预测最佳聚焦的可能性。扫描实验还表明,自动聚焦可以至少以0.25秒/视野的速度进行,且不会损失精度。

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