Smith G N, Flynn S W, Kopala L C, Bassett A S, Lapointe J S, Falkai P, Honer W G
Department of Psychiatry, University of British Columbia, Vancouver, Canada.
Acta Psychiatr Scand. 1997 Nov;96(5):395-401. doi: 10.1111/j.1600-0447.1997.tb09935.x.
Morphological brain abnormalities are common in schizophrenia, although the aetiological and clinical significance of these findings is largely unknown. Substantial between-subject variability suggests that large samples are needed to study the full implications of brain pathomorphology. Computerized tomography (CT) is frequently used routinely in schizophrenia, and large numbers of scans are available for study. This article describes the development and statistical properties of a rapid and simple method of assessing CT scans. The CT Rating Scale for Schizophrenia (CTRSS) is minimally affected by variability in scanning procedures, is reliable, and accurately estimates area and volumetric measures of brain spaces. By promoting the comprehensive assessment of large numbers of routinely obtained scans, the CTRSS would allow the investigation of variables that may systematically affect results (e.g. gender and age) and variables with low prevalence. The CTRSS provides a useful adjunct to technologically more sophisticated methods of assessment such as magnetic resonance imaging (MRI).
脑形态学异常在精神分裂症中很常见,尽管这些发现的病因学和临床意义在很大程度上尚不清楚。个体间存在显著差异,这表明需要大样本才能全面研究脑病理形态学的意义。计算机断层扫描(CT)在精神分裂症研究中经常被常规使用,并且有大量扫描数据可供研究。本文描述了一种快速、简单的CT扫描评估方法的开发及其统计学特性。精神分裂症CT评定量表(CTRSS)受扫描程序变异性的影响最小,具有可靠性,并且能够准确估计脑腔的面积和容积测量值。通过促进对大量常规获取的扫描数据进行全面评估,CTRSS将有助于研究可能系统影响结果的变量(如性别和年龄)以及低患病率变量。CTRSS为诸如磁共振成像(MRI)等技术上更复杂的评估方法提供了有用的辅助手段。