Schutte B, Nuydens R, Geerts H, Ramaekers F
Department of Molecular Cell Biology and Genetics, University of Maastricht, The Netherlands.
J Neurosci Methods. 1998 Dec 31;86(1):63-9. doi: 10.1016/s0165-0270(98)00147-2.
We describe a rapid and reliable method to quantitate the extent of apoptosis in neuronal cell cultures. Based on their annexin V-affinity, resulting from phosphatidylserine (PS) exposure at the outer leaflet of the plasma membrane, apoptotic cells can be distinguished from annexin V-negative living cells, by using microscopic and flow cytometric procedures. When combined with propidium iodide (PI) the double labeling procedure allows a further distinction of necrotic (annexin V+/PI+), apoptotic (annexin V+/PI-) cells. Furthermore, when the cells are incubated with annexin V prior to harvesting, the former cell populations can be separated from cells damaged during isolation (annexin V-/PI+). In the present paper, we show that the annexin V-binding assay is also applicable to differentiated neuronal cells with fragile neurite outgrowths.
我们描述了一种快速且可靠的方法来定量神经元细胞培养物中的细胞凋亡程度。基于细胞膜外小叶上磷脂酰丝氨酸(PS)暴露所产生的膜联蛋白V亲和力,通过显微镜和流式细胞术程序,可将凋亡细胞与膜联蛋白V阴性的活细胞区分开来。当与碘化丙啶(PI)结合使用时,双重标记程序可进一步区分坏死细胞(膜联蛋白V+/PI+)、凋亡细胞(膜联蛋白V+/PI-)。此外,在收获细胞之前用膜联蛋白V孵育细胞时,可将前一类细胞群体与分离过程中受损的细胞(膜联蛋白V-/PI+)分开。在本文中,我们表明膜联蛋白V结合测定法也适用于具有脆弱神经突生长的分化神经元细胞。