Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany.
Spin-X Institute, Electron Microscopy Center, School of Physics and Optoelectronics, State Key Laboratory of Luminescent Materials and Devices, Guangdong-Hong Kong-Macao Joint Laboratory of Optoelectronic and Magnetic Functional Materials, South China University of Technology, Guangzhou 511442, China.
Nano Lett. 2023 Feb 8;23(3):843-849. doi: 10.1021/acs.nanolett.2c03879. Epub 2023 Jan 23.
The operation of nanoscale electronic devices is related intimately to the three-dimensional (3D) charge density distributions within them. Here, we demonstrate the quantitative 3D mapping of the charge density and long-range electric field associated with an electrically biased carbon fiber nanotip with a spatial resolution of approximately 5 nm using electron holographic tomography in the transmission electron microscope combined with model-based iterative reconstruction. The approach presented here can be applied to a wide range of other nanoscale materials and devices.
纳米尺度电子器件的工作状态与其中的三维(3D)电荷密度分布密切相关。在这里,我们使用结合了基于模型的迭代重建的透射电子显微镜中的电子全息断层扫描技术,以大约 5nm 的空间分辨率展示了与受偏压碳纤维纳米尖端相关的电荷密度和长程电场的定量 3D 测绘。本文提出的方法可应用于广泛的其他纳米尺度材料和器件。