Politano Grazia Giuseppina
Department of Environmental Engineering, University of Calabria, 87036 Rende, Italy.
Nanomaterials (Basel). 2025 Jan 10;15(2):99. doi: 10.3390/nano15020099.
In this study, TiO-P25 films on FTO substrates were synthesized using the sol-gel process and studied using Variable Angle Spectroscopy Ellipsometry (VASE) to determine their optical constants and thickness. The measurements were carried out at room temperature in the wavelength range of (300-900) nm at incident angles varying from 55° to 70°. The resulting thicknesses were found to be around 1000 nm. A graded layer model, which allowed for accurate representation of the depth-dependent optical variations, was employed to model the properties of these TiO-P25 films. This modeling approach provided deeper insights into the internal structure of the films, particularly how the graded structural characteristics impact the overall optical behavior. Understanding these depth-dependent variations is essential for optimizing the use of TiO-P25 films in technologies such as solar cells and optical devices.
在本研究中，采用溶胶 - 凝胶法在FTO衬底上合成了TiO - P25薄膜，并使用可变角度光谱椭偏仪（VASE）对其进行研究，以确定其光学常数和厚度。测量在室温下进行，波长范围为（300 - 900）nm，入射角在55°至70°之间变化。所得厚度约为1000 nm。采用渐变层模型来模拟这些TiO - P25薄膜的特性，该模型能够准确表示与深度相关的光学变化。这种建模方法为薄膜的内部结构提供了更深入的见解，特别是渐变结构特征如何影响整体光学行为。了解这些与深度相关的变化对于优化TiO - P25薄膜在太阳能电池和光学器件等技术中的应用至关重要。
