In this study, TiO-P25 films on FTO substrates were synthesized using the sol-gel process and studied using Variable Angle Spectroscopy Ellipsometry (VASE) to determine their optical constants and thickness. The measurements were carried out at room temperature in the wavelength range of (300-900) nm at incident angles varying from 55° to 70°. The resulting thicknesses were found to be around 1000 nm. A graded layer model, which allowed for accurate representation of the depth-dependent optical variations, was employed to model the properties of these TiO-P25 films. This modeling approach provided deeper insights into the internal structure of the films, particularly how the graded structural characteristics impact the overall optical behavior. Understanding these depth-dependent variations is essential for optimizing the use of TiO-P25 films in technologies such as solar cells and optical devices.