利用超高真空可变温度原子力显微镜和扫描隧道显微镜进行原子分辨率的表面比较研究。

Comparative Surface Studies at Atomic Resolution with Ultrahigh Vacuum Variable-Temperature Atomic Force and Scanning Tunneling Microscopes.

作者信息

Iwatsuki M, Suzuki K, Kitamura S, Kersker M

机构信息

Electron Optics Division, JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196-8558, Japan

出版信息

Microsc Microanal. 1999 May;5(3):208-215. doi: 10.1017/s143192769900015x.

DOI:10.1017/s143192769900015x

PMID:10383993

Abstract

: With the ultrahigh vacuum variable-temperature scanning tunneling microscope (UHV-VT-STM), atomic-level observation has been achieved. An ultrahigh vacuum atomic force microscope (UHV-AFM) has also been developed, with success in obtaining atom images where observation in noncontact (NC) mode with a frequency modulation (FM) detection method was attempted. Using the FM detection method in the constant oscillation amplitude of the cantilever excitation mode, we have obtained atomic-resolution images of Si(111) 7 x 7 structures and Si(100) 2 x 1 structures and other structures together with STM images in an ultrahigh vacuum environment. Also shown here are contact potential difference (CPD) images using the NC-AFM method.

摘要

利用超高真空可变温度扫描隧道显微镜（UHV-VT-STM），已实现原子级别的观测。还开发了超高真空原子力显微镜（UHV-AFM），并成功获得了原子图像，其中尝试采用调频（FM）检测方法在非接触（NC）模式下进行观测。在悬臂激发模式的恒定振荡幅度下使用FM检测方法，我们在超高真空环境中获得了Si(111) 7×7结构、Si(100) 2×1结构及其他结构的原子分辨率图像以及STM图像。此处还展示了使用NC-AFM方法的接触电势差（CPD）图像。