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耗散对超导单电子晶体管的影响。

Effects of dissipation on a superconducting single electron transistor.

作者信息

Kycia J B, Chen J, Therrien R, Kurdak C, Campman K L, Gossard A C, Clarke J

机构信息

Department of Physics, University of California, Berkeley, California 94720, USA.

出版信息

Phys Rev Lett. 2001 Jul 2;87(1):017002. doi: 10.1103/PhysRevLett.87.017002. Epub 2001 Jun 13.

Abstract

We measure the effect of dissipation on the minimum zero-bias conductance, G(min)0, of a superconducting single electron transistor (sSET) capacitively coupled to a two-dimensional electron gas (2DEG) in a GaAs/AlGaAs heterostructure. Depleting the 2DEG with a back gate voltage decreases the dissipation experienced by the sSET in situ. We find that G(min)0 increases as the dissipation is increased or the temperature is reduced; the functional forms of these dependences are compared with the model of Wilhelm et al. in which the leads coupled to the sSET are represented by lossy transmission lines.

摘要

我们测量了耗散对与砷化镓/铝镓砷异质结构中的二维电子气(2DEG)电容耦合的超导单电子晶体管(sSET)的最小零偏置电导G(min)0的影响。通过背栅电压耗尽2DEG会原位降低sSET所经历的耗散。我们发现,随着耗散增加或温度降低,G(min)0会增大;将这些依赖关系(函数形式)与威廉等人的模型进行了比较,在该模型中,耦合到sSET的引线由有损耗传输线表示。

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