Kycia J B, Chen J, Therrien R, Kurdak C, Campman K L, Gossard A C, Clarke J
Department of Physics, University of California, Berkeley, California 94720, USA.
Phys Rev Lett. 2001 Jul 2;87(1):017002. doi: 10.1103/PhysRevLett.87.017002. Epub 2001 Jun 13.
We measure the effect of dissipation on the minimum zero-bias conductance, G(min)0, of a superconducting single electron transistor (sSET) capacitively coupled to a two-dimensional electron gas (2DEG) in a GaAs/AlGaAs heterostructure. Depleting the 2DEG with a back gate voltage decreases the dissipation experienced by the sSET in situ. We find that G(min)0 increases as the dissipation is increased or the temperature is reduced; the functional forms of these dependences are compared with the model of Wilhelm et al. in which the leads coupled to the sSET are represented by lossy transmission lines.
我们测量了耗散对与砷化镓/铝镓砷异质结构中的二维电子气(2DEG)电容耦合的超导单电子晶体管(sSET)的最小零偏置电导G(min)0的影响。通过背栅电压耗尽2DEG会原位降低sSET所经历的耗散。我们发现,随着耗散增加或温度降低,G(min)0会增大;将这些依赖关系(函数形式)与威廉等人的模型进行了比较,在该模型中,耦合到sSET的引线由有损耗传输线表示。