Electron-microscope study of the effect of chlorhexidine on Pseudomonas aeruginosa.

Electron micrographs of cytological damage to log phase Pseudomonas aeruginosa caused by low consentrations of chlorhexidine indicate an action primarily on the cytoplasmic membrane at concentration of 2.0--3.0 micrograms/ml chlorhexidine, and on the cytoplasmic membrane plus layers external to it at concentrations greater than 3.0 micrograms/ml. Evidence of two types of resistance to chlorhexidine is presented.