Improvement of the interferometric method for measuring electro-optic coefficients of poled polymer thin films.

The interferometric method for measuring the linear electro-optic coefficients of polymer films has been improved. This improved method is based on using the antipiezoelectric effect of a quartz crystal to compensate for the change in the optical path length that is due to the electro-optic effect of a polymer film. The electro-optic coefficients of six kinds of new poled polymer film have been determined at a wavelength of 633 nm by this new method. This technique offers a simple, rapid, and highly sensitive method for measuring the electro-optic coefficients of polymer films.