Linacre John M, Wright Benjamin D
University of Chicago, Chicago, IL 60681-1322, USA.
J Appl Meas. 2002;3(4):486-512.
An extension to the Rasch model for fundamental measurement is described in which there is parameterization not only for examinee ability and item difficulty but also for judge severity. Variants of this model are discussed and judging plans reviewed. Its use and characteristics are explained by an application of the model to an empirical testing situation. A comparison with Generalizability Theory using a common data set is presented as a contrast in approaches to resolving judge indeterminacy.
本文描述了一种对基本测量的拉施模型的扩展,其中不仅对考生能力和项目难度进行了参数化,还对评判者的严格程度进行了参数化。讨论了该模型的变体并回顾了评判计划。通过将该模型应用于实证测试情境来解释其用途和特征。作为解决评判者不确定性方法的对比,给出了使用共同数据集与概化理论的比较。