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水稻叶绿素缺乏突变体显示出因重离子辐照导致的一个DNA片段缺失。

Chlorophyll-deficient mutants of rice demonstrated the deletion of a DNA fragment by heavy-ion irradiation.

作者信息

Abe Tomoko, Matsuyama Tomoki, Sekido Shigeko, Yamaguchi Isamu, Yoshida Shigeo, Kameya Toshiaki

机构信息

Plant Functions Lab. RIKEN, Hirosawa, Wako-shi, Saitama 351-0198, Japan.

出版信息

J Radiat Res. 2002 Dec;43 Suppl:S157-61. doi: 10.1269/jrr.43.s157.

Abstract

Heavy-ion irradiation is a new method of mutation breeding to produce new cultivars. We established the application of this method in rice plants to obtain mutants. Rice seeds were irradiated by C or Ne ions (135MeV/u) with a LET (linear energy transfer) of 22.7 or 64.2 keV/microm, respectively. Chlorophyll-deficient mutants (CDM) segregated in M2 progeny were albino, pale-green, yellow or striped-leave phenotypes. The highest rate of CDM with C-ion irradiation, 7.31%, was obtained at 40 Gy among the doses examined. Ne-ion irradiation gave the highest rate, 11.6%, at 20 Gy. We used the RLGS (Restriction Landmark Genomic Scanning) method to analyze DNA deletion in an albino mutant genome. Not I-landmark RLGS profiles detected about 2000 spots in rice. We found that one of the polymorphic spots was strongly linked to the albino phenotypic mutant derived from deleting of a DNA fragment, and demonstrated the high ability to detect of polymorphic regions by the RLGS method.

摘要

重离子辐照是一种用于培育新品种的新型诱变育种方法。我们将此方法应用于水稻植株以获得突变体。分别用线能量转移(LET)为22.7 keV/μm或64.2 keV/μm的碳离子或氖离子(135MeV/u)辐照水稻种子。在M2代中分离出的叶绿素缺乏突变体(CDM)表现为白化、淡绿、黄色或条纹叶表型。在所检测的剂量中,碳离子辐照在40 Gy时获得了最高的CDM发生率,为7.31%。氖离子辐照在20 Gy时获得了最高发生率,为11.6%。我们使用限制性地标基因组扫描(RLGS)方法分析白化突变体基因组中的DNA缺失。Not I地标RLGS图谱在水稻中检测到约2000个位点。我们发现其中一个多态性位点与因DNA片段缺失产生的白化表型突变体紧密连锁,并证明了RLGS方法检测多态性区域的高能力。

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