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一个年轻的Alu Yb9元件插入内含子导致的外显子跳跃会引发严重的甲型血友病。

Exon skipping caused by an intronic insertion of a young Alu Yb9 element leads to severe hemophilia A.

作者信息

Ganguly Arupa, Dunbar Tanya, Chen Peiqin, Godmilow Lynn, Ganguly Tapan

机构信息

Department of Genetics, University of Pennsylvania, Philadelphia, PA 19104, USA.

出版信息

Hum Genet. 2003 Sep;113(4):348-52. doi: 10.1007/s00439-003-0986-5. Epub 2003 Jul 12.

Abstract

Short interspersed elements, such as Alu elements, have propagated to more than one million copies in the human genome. They affect the genome in several ways, caused by retrotransposition, recombination between elements, gene conversion, and alterations in gene expression. These events, including novel insertions into active genes, have been associated with a number of human disorders. Hemophilia A is an X-linked severe bleeding disorder and is caused by mutations in the Factor VIII gene. The spectrum of mutations includes point mutations, rearrangements, insertions, and deletions. Recently, an Alu retrotransposition event in a coding exon has been reported in a family with a severe form of hemophilia A. This was the first report of an Alu insertion in the Factor VIII gene. Here, we report a second Alu insertion event that lies in an intron of the same gene that causes exon skipping and the complete disruption of gene expression.

摘要

短散在元件,如Alu元件,在人类基因组中已扩增到超过一百万个拷贝。它们通过逆转座、元件间重组、基因转换和基因表达改变等多种方式影响基因组。这些事件,包括新插入到活性基因中,已与多种人类疾病相关联。甲型血友病是一种X连锁的严重出血性疾病,由凝血因子VIII基因突变引起。突变谱包括点突变、重排、插入和缺失。最近,在一个患有严重甲型血友病的家庭中,报道了编码外显子中的一次Alu逆转座事件。这是凝血因子VIII基因中Alu插入的首次报道。在此,我们报告了第二个Alu插入事件,该事件位于同一基因的一个内含子中,导致外显子跳跃和基因表达的完全破坏。

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