Petrov N I, Woo G M, Lee M B
Storage Laboratory, Samsung Advanced Institute of Technology, PO Box 111, Suwon 440-600, Korea.
J Microsc. 2003 Nov;212(Pt 2):169-74. doi: 10.1046/j.1365-2818.2003.01224.x.
A far-field method for characterizing apertures based on the relationship between the relative intensity of propagating modes in a given medium and a small aperture illuminated with a light beam is proposed. A simple optical set-up based on computer-generated holograms and spatial filters is suggested to measure the relative strength of modes and provide axial intensity measurements in the far-field zone. It is shown that the minimal size of a spot that may be measured decreases with an increase in the refractive index of a medium into which light propagates and with the use of high-order spatial mode filters. The intensities transmitted through tapered optical fibre tips have been measured and their aperture diameters determined using window-type spatial filters. The results have been compared with measurements using scanning electron microscopy.
提出了一种基于给定介质中传播模式的相对强度与被光束照射的小孔之间关系来表征孔径的远场方法。建议采用基于计算机生成全息图和空间滤波器的简单光学装置来测量模式的相对强度,并在远场区域提供轴向强度测量。结果表明,可测量光斑的最小尺寸随着光传播介质折射率的增加以及高阶空间模式滤波器的使用而减小。已测量了通过锥形光纤尖端传输的强度,并使用窗口型空间滤波器确定了它们的孔径直径。已将结果与使用扫描电子显微镜的测量结果进行了比较。