Resolution enhancement of pHe+ atomic line profiles measured with a pulsed dye laser and a Fizeau wavelength meter.

A Fizeau wavelength meter was used to compensate for fluctuations in the longitudinal mode structure and wavelength of a pulsed dye laser. The average laser linewidth was effectively narrowed by selection of laser pulses with a single longitudinal mode. These techniques were recently employed to measure some atomic transition wavelengths in pHe+ to fractional precisions greater than 1 part in 10(7). The wavelengths were absolutely calibrated against iodine or tellurium lines by absorption spectroscopy or against neon or argon lines by optogalvanic spectroscopy.