Kondratyev Alexei, Gale Karen
Department of Pharmacology, Georgetown University, Washington, DC, USA.
Brain Res Mol Brain Res. 2004 Feb 5;121(1-2):86-94. doi: 10.1016/j.molbrainres.2003.11.005.
The molecular mechanisms mediating degeneration in response to neuronal insults, including damage evoked by prolonged seizure activity, show substantial variability across laboratories and injury models. Here we investigate the extent to which the proportion of cell death occurring by apoptotic vs. necrotic mechanisms may be shifted by changing the temporal parameters of the insult. In initial studies with continuous seizures (status epilepticus, SE), signs of apoptotic degeneration were most clearly observed when SE occurred following a long latency (>86 min) after injection of kainic acid as compared with a short-latency SE (<76 min). Therefore, in this study we directly compared short- with long-latency SE for the expression of molecular markers for apoptosis and necrosis in an especially vulnerable brain region (rhinal cortex). Molecular markers of apoptosis (DNA fragmentation, cleavage of ICAD, an inhibitor of "caspase-activated DNase" (CAD), and prevalence of a caspase-generated fragment of alpha-spectrin) were detected following long-latency SE. Short-latency SE resulted in expression of predominantly necrotic features of cell death, such as "non-ladder" pattern of genomic DNA degradation, prevalence of a calpain-generated alpha-spectrin fragment, and absence of ICAD cleavage. Silver staining revealed no significant difference in the extent and spatial distribution of degeneration between long- or short-latency SE. These data indicate that the latency to onset of SE determines the extent to which apoptotic or necrotic mechanisms contribute to the degeneration following SE. The presence of a long latency period, during which multiple brief seizure episodes may occur, favors the occurrence of apoptotic cell death. It is possible that the absence of such "preconditioning" period in short-latency SE favors predominantly necrotic profile.
介导神经元损伤后变性的分子机制,包括长时间癫痫活动引发的损伤,在不同实验室和损伤模型中表现出很大差异。在这里,我们研究了通过改变损伤的时间参数,凋亡与坏死机制导致的细胞死亡比例可能发生变化的程度。在连续癫痫发作(癫痫持续状态,SE)的初步研究中,与短潜伏期SE(<76分钟)相比,当在注射 kainic 酸后长时间潜伏期(>86分钟)出现SE时,凋亡性变性的迹象最为明显。因此,在本研究中,我们直接比较了短潜伏期与长潜伏期SE在一个特别易损脑区(嗅皮质)中凋亡和坏死分子标志物的表达情况。长潜伏期SE后检测到凋亡分子标志物(DNA片段化、ICAD裂解,“半胱天冬酶激活的脱氧核糖核酸酶”(CAD)的抑制剂,以及半胱天冬酶产生的α-血影蛋白片段的存在)。短潜伏期SE导致细胞死亡主要表现为坏死特征,如基因组DNA降解的“非梯形”模式、钙蛋白酶产生的α-血影蛋白片段的存在以及ICAD裂解的缺失。银染色显示长潜伏期或短潜伏期SE之间变性的程度和空间分布没有显著差异。这些数据表明,SE发作的潜伏期决定了凋亡或坏死机制对SE后变性的贡献程度。存在长潜伏期,在此期间可能发生多次短暂癫痫发作,有利于凋亡性细胞死亡的发生。短潜伏期SE中缺乏这种“预处理”期可能主要有利于坏死特征的出现。