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分层物体的外部质子束分析。

External proton beam analysis of layered objects.

作者信息

Wagner W, Neelmeijer C

机构信息

Forschungszentrum Rossendorf, Abteilung FWIA, Postfach 510119, D-01314, Dresden, Germany.

出版信息

Anal Bioanal Chem. 1995 Oct;353(3-4):297-302. doi: 10.1007/s0021653530297.

Abstract

Ion-beam analysis for determining the elemental composition and to obtain depth information has been carried out with MeV protons in air by means of simultaneous external PIXE and RBS. Stainless steel products of extended size and a historic painting are analyzed non-destructively. These objects include systems of layers with areal densities up to some ten mg/cm(2). Depth information is obtained by PIXE using energy variation of the primary proton beam and in addition directly from RBS for the outermost near-surface region. Main and secondary elements as well as impurities can be determined together with areal densities. Particularly, the knowledge on the depth distribution of the pigments in paintings provides information on paint techniques.

摘要

已通过同时进行外部质子激发X射线发射(PIXE)和卢瑟福背散射(RBS),利用兆电子伏特质子在空气中进行离子束分析,以确定元素组成并获取深度信息。对大型不锈钢产品和一幅历史画作进行了无损分析。这些物体包括面密度高达约十毫克每平方厘米的层状系统。通过使用初级质子束的能量变化的PIXE获取深度信息,此外,对于最外层近表面区域,还可直接从RBS获得深度信息。主要元素、次要元素以及杂质连同面密度均可确定。特别地,关于绘画中颜料深度分布的知识提供了有关绘画技巧的信息。

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