Shinohara A H, Kamo M, Suzuki C K
UNICAMP - University of Campinas, Faculty of Mechanical Engineering, Department of Materials Engineering, CP6122, 13081-970, Campinas-SP, Brazil.
J Synchrotron Radiat. 1998 May 1;5(Pt 3):654-6. doi: 10.1107/S0909049598000867.
A homoepitaxic single-crystal diamond (111) film grown by microwave-assisted chemical vapour deposition (CVD) and fractured along the [110] directions to form small triangles was investigated by X-ray double-crystal topography. The X-ray topographic image showed that all parts of the cleaved CVD diamond film sections uniformly reflected X-rays at the peak position of the rocking curve, which was measured in the Bragg case. Furthermore, no bending effect was observed and the CVD diamond film appeared to be more perfect than and showed higher integrated intensity than the natural diamond substrate.