小波模极大值在微阵列斑点识别中的应用。

Application of wavelet modulus maxima in microarray spots recognition.

作者信息

Wang X H, Istepanian Robert S H, Song Yong Hua

机构信息

Mobile Information and Network Technologies Centre, School of Computing and Information Systems, Kingston University, London, Kingston Upon Thames KT1 2EE, UK.

出版信息

IEEE Trans Nanobioscience. 2003 Dec;2(4):190-2. doi: 10.1109/tnb.2003.816230.

DOI:10.1109/tnb.2003.816230

PMID:15376908

Abstract

This paper presents a novel approach to recognize the microarray image spots. The approach is based on the detection of wavelet modulus maxima in the microarray images. The detected maxima is actually the contour of the spots and thus the spots are recognized precisely. Then, the intensities within the contour of the spots can be obtained with low error rate. The test results on example image show this is an effective approach, especially for those spots with low intensities.

摘要

本文提出了一种识别微阵列图像斑点的新方法。该方法基于检测微阵列图像中的小波模极大值。检测到的极大值实际上就是斑点的轮廓，从而能够精确识别斑点。然后，可以以较低的错误率获得斑点轮廓内的强度。对示例图像的测试结果表明这是一种有效的方法，尤其适用于那些低强度的斑点。