对任意形状尖端的电场敏感扫描探针测量进行建模。

Modeling electric-field-sensitive scanning probe measurements for a tip of arbitrary shape.

作者信息

Kuljanishvili Irma, Chakraborty Subhasish, Maasilta I J, Tessmer S H, Melloch M R

机构信息

Department of Physics and Astronomy, Michigan State University, 4237 Biomedical Physical Sciences, East Lansing, MI 48824-2320, USA.

出版信息

Ultramicroscopy. 2004 Dec;102(1):7-12. doi: 10.1016/j.ultramic.2004.07.004.

DOI:10.1016/j.ultramic.2004.07.004

PMID:15556695

Abstract

We present a numerical method to model electric-field-sensitive scanning probe microscopy measurements which allows for a tip of arbitrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is applied to calculate the spatial resolution of a subsurface charge accumulation imaging system, achieving reasonable agreement with experiment.

摘要

我们提出了一种数值方法来模拟电场敏感扫描探针显微镜测量，该方法允许使用任意形状的探针，并引入镜像电荷以精确考虑样品介电覆盖层。该方法用于计算地下电荷积累成像系统的空间分辨率，与实验结果达成了合理的一致。