Loos Joachim, Alexeev Alexander, Grossiord Nadia, Koning Cor E, Regev Oren
Laboratory of Materials and Interface Chemistry, Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands.
Ultramicroscopy. 2005 Sep;104(2):160-7. doi: 10.1016/j.ultramic.2005.03.007. Epub 2005 Apr 19.
The morphology of conductive nanocomposites consisting of low concentration of single-wall carbon nanotubes (SWNT) and polystyrene (PS) has been studied using atomic force microscopy (AFM), transmission electron microscopy (TEM) and, in particular, scanning electron microscopy (SEM). Application of charge contrast imaging in SEM allows visualization of the overall SWNT dispersion within the polymer matrix as well as the identification of individual or bundled SWNTs at high resolution. The contrast mechanism involved will be discussed. In conductive nanocomposites the SWNTs are homogeneously dispersed within the polymer matrix and form a network. Beside fairly straight SWNTs, strongly bended SWNTs have been observed. However, for samples with SWNT concentrations below the percolation threshold, the common overall charging behavior of an insulating material is observed preventing the detailed morphological investigation of the sample.
利用原子力显微镜(AFM)、透射电子显微镜(TEM),特别是扫描电子显微镜(SEM),对由低浓度单壁碳纳米管(SWNT)和聚苯乙烯(PS)组成的导电纳米复合材料的形态进行了研究。在SEM中应用电荷对比成像可以可视化聚合物基质中SWNT的整体分散情况,以及在高分辨率下识别单个或成束的SWNT。将讨论所涉及的对比机制。在导电纳米复合材料中,SWNT均匀地分散在聚合物基质中并形成网络。除了相当直的SWNT外,还观察到了强烈弯曲的SWNT。然而,对于SWNT浓度低于渗流阈值的样品,观察到绝缘材料常见的整体充电行为,这妨碍了对样品进行详细的形态学研究。