Chang S-L, Stetsko Yu P, Tang M-T, Lee Y-R, Sun W-H, Yabashi M, Ishikawa T
Department of Physics, National Tsing Hua University (NTHU), Hsinchu, Taiwan 300, Republic of China.
Phys Rev Lett. 2005 May 6;94(17):174801. doi: 10.1103/PhysRevLett.94.174801. Epub 2005 May 5.
X-ray back diffraction from monolithic two silicon crystal plates of 25-150 microm thickness and a 40-150 microm gap using synchrotron radiation of energy resolution DeltaE = 0.36 meV at 14.4388 keV clearly show resonance fringes inside the energy gap and the total-reflection range for the (12 4 0) reflection. This cavity resonance results from the coherent interaction between the x-ray wave fields generated by the two plates with a gap smaller than the x-ray coherence length. This finding opens up new opportunities for high-resolution and phase-contrast x-ray studies, and may lead to new developments in x-ray optics.
使用能量分辨率ΔE = 0.36 meV、能量为14.4388 keV的同步辐射,对两块厚度为25 - 150微米、间隙为40 - 150微米的单片硅晶体板进行X射线背向衍射,清晰地显示出能隙内的共振条纹以及(12 4 0)反射的全反射范围。这种腔共振是由间隙小于X射线相干长度的两块板所产生的X射线波场之间的相干相互作用导致的。这一发现为高分辨率和相衬X射线研究开辟了新机会,并可能引领X射线光学领域的新发展。