Image of a straight edge in confocal self-interference microscopy.

作者信息

Kang DongKyun, Gweon DaeGab

机构信息

Nano Opto Mechatronics Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, Gusung-dong, Yusung-gu, Daejeon, South Korea.

出版信息

Opt Lett. 2005 Jul 1;30(13):1650-2. doi: 10.1364/ol.30.001650.

DOI:10.1364/ol.30.001650

PMID:16075526

Abstract

An image of a straight edge in confocal self-interference microscopy (CSIM) is analyzed. Simulations of edge images based on a two-dimensional imaging equation are presented that show a 103% increase in edge gradient and a 43.1% decrease in the 10-90% width. The first experimental results, to our knowledge, for CSIM are presented and show good agreement with the simulation results and a 23% decrease in the 10-90% width.

摘要